TLP137_07 Datasheet, PDF (2/9 Pages) Toshiba Semiconductor – Photo−Transistor Office Machine

TLP137
Absolute Maximum Ratings (Ta = 25°C)
Characteristic
Symbol
Rating
Unit
Forward current
Forward current derating (Ta ≥ 53°C)
Peak forward current (100μs pulse, 100pps)
Reverse voltage
Junction temperature
Collector−emitter voltage
Collector−base voltage
Emitter−collector voltage
Emitter−base voltage
Collector current
Peak collector current (10ms pulse, 100pps)
Power dissipation
Power dissipation derating (Ta ≥ 25°C)
Junction temperature
Storage temperature range
Operating temperature range
Lead soldering temperature (10s)
Total package power dissipation
Total package power dissipation derating (Ta ≥ 25°C)
Isolation voltage (AC, 1min., RH ≤ 60%)
I_F
ΔI_F / °C
I_FP
V_R
T_j
V_CEO
V_CBO
V_ECO
V_EBO
I_C
I_CP
P_C
ΔP_C / °C
T_j
T_stg
T_opr
T_sol
P_T
ΔP_T / °C
(Note 1) BV_S
50
−0.7
1
5
125
80
80
7
7
50
100
150
−1.5
125
−55~125
−55~100
260
200
−2.0
3750
mA
mA / °C
A
V
°C
V
V
V
V
mA
mA
mW
mW / °C
°C
°C
°C
°C
mW
mW / °C
Vrms
Note: Using continuously under heavy loads (e.g. the application of high temperature/current/voltage and the
significant change in temperature, etc.) may cause this product to decrease in the reliability significantly even
if the operating conditions (i.e. operating temperature/current/voltage, etc.) are within the absolute maximum
ratings.
Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook
(“Handling Precautions”/“Derating Concept and Methods”) and individual reliability data (i.e. reliability test
report and estimated failure rate, etc).
(Note 1) Device considered a two terminal device: Pins 1 and 3 shorted together and pins 4, 5 and 6 shorted
together.
2
2007-10-01