TC74VHC139F_07 Datasheet, PDF (2/8 Pages) Toshiba Semiconductor – Dual 2-to-4 Line Decoder

IEC Logic Symbol
TC74VHC139F/FN/FT
1A ⁽²⁾
1B ⁽³⁾
1G ⁽¹⁾
2A ⁽¹⁴⁾
2B ⁽¹³⁾
2G ⁽¹⁵⁾
X/Y
1
2
EN
0 ⁽⁴⁾ 1Y0
1 ⁽⁵⁾ 1Y1
2 ⁽⁶⁾ 1Y2
3 ⁽⁷⁾ 1Y3
(12) _2Y0
(11) _2Y1
(10) _2Y2
(9)
2Y3
1A ⁽²⁾
1B ⁽³⁾
1G ⁽¹⁾
DMUX 0 ⁽⁴⁾
0
1 G0
3
1 ⁽⁵⁾
2 ⁽⁶⁾
3 ⁽⁷⁾
1Y0
1Y1
1Y2
1Y3
2A ⁽¹⁴⁾
2B ⁽¹³⁾
2G ⁽¹⁵⁾
(12) _2Y0
(11) _2Y1
(10) _2Y2
(9)
2Y3
Truth Table
Inputs
Enable
Select
G
B
A
H
X
X
L
L
L
L
L
H
L
H
L
L
H
H
X: Don’t care
System Diagram
Outputs
Y0 Y1 Y2 Y3
H
H
H
H
L
H
H
H
H
L
H
H
H
H
L
H
H
H
H
L
Selected
Output
None
Y0
Y1
Y2
Y3
2/14
A
3/13
B
1/15
G
4/12
Y0
5/11
Y1
6/10
Y2
7/9
Y3
Absolute Maximum Ratings (Note)
Characteristics
Symbol
Rating
Unit
Supply voltage range
DC input voltage
DC output voltage
Input diode current
Output diode current
DC output current
DC V_CC/ground current
Power dissipation
Storage temperature
V_CC
V_IN
V_OUT
I_IK
I_OK
I_OUT
I_CC
P_D
T_stg
−0.5 to 7.0
V
−0.5 to 7.0
V
−0.5 to V_CC + 0.5
V
−20
mA
±20
mA
±25
mA
±75
mA
180
mW
−65 to 150
°C
Note:
Exceeding any of the absolute maximum ratings, even briefly, lead to deterioration in IC performance or
even destruction.
Using continuously under heavy loads (e.g. the application of high temperature/current/voltage and the
significant change in temperature, etc.) may cause this product to decrease in the reliability significantly
even if the operating conditions (i.e. operating temperature/current/voltage, etc.) are within the absolute
maximum ratings and the operating ranges.
Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook
(“Handling Precautions”/“Derating Concept and Methods”) and individual reliability data (i.e. reliability test
report and estimated failure rate, etc).
2
2007-10-01