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HN7G02FE Datasheet, PDF (2/7 Pages) Toshiba Semiconductor – Power Management Switch Applications, Inverter Circuit
Q1 (Transistor) Electrical Characteristics (Ta = 25°C)
Characteristic
Collector cutoff current
Emitter cutoff current
DC current gain
Collector-emitter saturation voltage
Input resistor
Symbol
Test Condition
ICBO
IEBO
hFE
VCE (sat)
R1
VCB = −50 V, IE = 0
VEB = −5 V, IC = 0
VCE = −5 V, IC = −1 mA
IC = −5 mA, IB = −0.25 mA
⎯
HN7G02FE
Min Typ. Max Unit
⎯
⎯ −100 nA
⎯
⎯ −100 nA
120
⎯
400
⎯
−0.1 −0.3
V
3.29 4.7 6.11 kΩ
Q2 (MOSFET) Electrical Characteristics (Ta = 25°C)
Characteristics
Gate leakage current
Drain-source breakdown voltage
Drain cutoff current
Gate threshold voltage
Forward transfer admittance
Drain-source ON-resistance
Input capacitance
Reverse transfer capacitance
Output capacitance
Switching time
Turn-on time
Turn-off time
Symbol
Test Condition
Min Typ. Max Unit
IGSS
VGS = 10 V, VDS = 0
⎯
⎯
1
μA
V (BR) DSS ID = 100 μA, VGS = 0
20
⎯
⎯
V
IDSS
VDS = 20 V, VGS = 0
⎯
⎯
1
μA
Vth
VDS = 3 V, ID = 0.1 mA
0.7
⎯
1.3
V
⎪Yfs⎪
VDS = 3 V, ID = 10 mA
25
50
⎯
mS
RDS (ON) ID = 10 mA, VGS = 2.5 V
⎯
4
12
Ω
Ciss
VDS = 3 V, VGS = 0, f = 1 MHz
⎯ 11.0 ⎯
pF
Crss
VDS = 3 V, VGS = 0, f = 1 MHz
⎯
3.3
⎯
pF
Coss
VDS = 3 V, VGS = 0, f = 1 MHz
⎯
9.3
⎯
pF
ton
VDD = 3 V, ID = 10 mA, VGS = 0~2.5 V
⎯
0.16
⎯
μs
toff
VDD = 3 V, ID = 10 mA, VGS = 0~2.5 V
⎯
0.19
⎯
Switching Time Test Circuit
(a) Switching time test circuit
2.5 V
IN
0
10 μS
VIN
ID
VDD = 3 V
OUT D.U. <= 1%
VIN: tr, tf < 5 ns
(Zout = 50 Ω)
Common source
Ta = 25°C
VDD
(b) VIN
VGS
(c) VOUT
VDS
2.5 V
90%
0
VDD
VDS (ON)
10%
90%
10%
tr
tf
ton
toff
2
2007-11-01