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| HN2D03F_14 Datasheet, PDF (2/4 Pages) Toshiba Semiconductor – High-Speed Switching Application | |||
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Fig.1 Reverse Recovery Time (trr) Test Circuit
HN2D03F
10ns
Pin Assignment (top view)
65 4
Q3
Q1 Q2
12 3
Marking
65 4
A7
12 3
2
2014-03-01
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