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HN2D03F_14 Datasheet, PDF (1/4 Pages) Toshiba Semiconductor – High-Speed Switching Application | |||
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TOSHIBA Diode Silicon Epitaxial Planar Type
HN2D03F
High-Speed Switching Application
z Small package
z Low forward voltage
z Small total capacitance
: VF (2) = 0.94 V (typ.)
: CT = 2.5 pF (typ.)
HN2D03F
Unit: mm
Absolute Maximum Ratings (Ta = 25°C)
Characteristic
Symbol
Rating
Unit
Maximum (peak) reverse voltage
VRM
420
V
Reverse voltage
VR
400
V
Maximum (peak) forward current
IFM
300*
mA
Average forward current
IO
100*
mA
Surge current (10ms)
Power dissipation
Junction temperature
Storage temperature
IFSM
P
Tj
Tstg
2*
A
300**
mW
150
°C
â55 to 150
°C
1.CATHODE(C1)
2.CATHODE(C2)
3.CATHODE(C3)
4.ANODE (A3)
5.ANODE (A2)
6.ANODE (A1)
Note: Using continuously under heavy loads (e.g. the application of high JEDEC
â
temperature/current/voltage and the significant change in
JEITA
â
temperature, etc.) may cause this product to decrease in the
TOSHIBA
1-3K1C
reliability significantly even if the operating conditions (i.e. operating Weight: 15 mg (typ.)
temperature/current/voltage, etc.) are within the absolute maximum
ratings.
Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook
(âHandling Precautionsâ/âDerating Concept and Methodsâ) and individual reliability data (i.e. reliability test
report and estimated failure rate, etc).
*: Absolute Maximum Ratings per each one of Q1, Q2 or Q3. In case of simultaneous use, the Absolute Maximum
Ratings per diode shall be derated to 75%.
**: Total rating
Electrical Characteristics (Q1, Q2, Q3, Common, Ta = 25°C)
Characteristic
Forward voltage
Reverse current
Total capacitance
Reverse recovery time
Symbol
VF (1)
VF (2)
IR (1)
IR (2)
CT
trr
Test
Circuit
Test Condition
Min Typ. Max Unit
â IF = 10 mA
â IF = 100 mA
â
0.8
â
V
â 0.94 1.3
â VR = 300 V
â VR = 400 V
â
â 0.05
μA
â
â
0.1
â VR = 0 V, f = 1 MHz
â
2.5
â
pF
â IF = 10 mA
(fig.1) â
0.5
â
μs
Start of commercial production
2002-04
1
2014-03-01
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