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| HN2D03F Datasheet, PDF (2/4 Pages) Toshiba Semiconductor – High Speed Switching Application | |||
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Pin Assignment (Top View)
Marking
65 4
Q3
A7
Q1 Q2
12 3
Fig.1 Reverse Recovery Time (trr) Test Circuit
HN2D03F
10ns
2
2007-11-22
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