HN2D03F Datasheet, PDF (1/4 Pages) Toshiba Semiconductor – High Speed Switching Application

TOSHIBA Diode Silicon Epitaxial Planar Type
HN2D03F
High Speed Switching Application
z Small package
z Low forward voltage
z Small total capacitance
: V_{F (2)} = 0.94V (typ.)
: C_T = 2.5pF (typ.)
HN2D03F
Unit in mm
Absolute Maximum Ratings (Ta = 25°C)
Characteristic
Symbol
Rating
Unit
Maximum (peak) reverse voltage
V_RM
420
V
Reverse voltage
V_R
400
V
Maximum (peak) forward current
I_FM
300*
mA
Average forward current
I_O
100*
mA
Surge current (10ms)
Power dissipation
Junction temperature
Storage temperature
I_FSM
P
T_j
T_stg
2*
A
300**
mW
150
°C
−55~150
°C
1.CATHODE(C1)
2.CATHODE(C2)
3.CATHODE(C3)
4.ANODE (A3)
5.ANODE (A2)
6.ANODE (A1)
Note: Using continuously under heavy loads (e.g. the application of high ^JEDEC
―
temperature/current/voltage and the significant change in
JEITA
―
temperature, etc.) may cause this product to decrease in the
TOSHIBA
1-3K1C
reliability significantly even if the operating conditions (i.e. operating _{Weight: 0.015mg(typ.)}
temperature/current/voltage, etc.) are within the absolute maximum
ratings.
Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook
(“Handling Precautions”/“Derating Concept and Methods”) and individual reliability data (i.e. reliability test
report and estimated failure rate, etc).
*: Absolute Maximum Ratings per each one of Q1,Q2 or Q3. In case of simultaneous use, the Absolute Maximum
Ratings per diode shall be derated to 75%.
**: Total rating
Electrical Characteristics (Q1, Q2, Q3, Common, Ta = 25°C)
Characteristic
Forward voltage
Reverse current
Total capacitance
Reverse recovery time
Symbol
V_{F (1)}
V_{F (2)}
I_{R (1)}
I_{R (2)}
C_T
t_rr
Test
Circuit
Test Condition
― I_F = 10mA
― I_F = 100mA
― V_R = 300V
― V_R = 400V
― V_R = 0, f = 1MHz
― I_F = 10mA (fig.1)
Min Typ. Max Unit
―
0.8
―
V
―
1.0
1.3
―
―
0.1
μA
―
―
1.0
―
2.5
―
pF
―
0.5
―
us
1
2007-11-22