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2SK3475_07 Datasheet, PDF (2/4 Pages) Toshiba Semiconductor – Silicon N Channel MOS Type VHF- and UHF-band Amplifier Applications
2SK3475
Electrical Characteristics (Ta = 25°C)
Characteristics
Symbol
Test Condition
Min Typ. Max Unit
Drain cut-off current
Gate-source leakage current
Threshold voltage
Drain-source on-voltage
Forward transconductance
Input capacitance
Output capacitance
Output power
Drain efficiency
Power gain
Low voltage output power
IDSS
VDS = 20 V, VGS = 0 V
⎯
⎯
5
µA
IGSS
VGS = 10 V
⎯
⎯
5
µA
Vth
VDS = 7.2 V, ID = 2 mA
1.9 2.4 2.9
V
VDS (ON) VGS = 10 V, ID = 75 mA
⎯
87
⎯
mV
Yfs
VDS = 7.2 V, IDS = 208 mA
⎯
260
⎯
mS
Ciss
VDS = 7.2 V, VGS = 0 V, f = 1 MHz ⎯
11
⎯
pF
Coss
VDS = 7.2 V, VGS = 0 V, f = 1 MHz
⎯
12.5
⎯
pF
PO
VDS = 7.2 V,
ηD
Iidle = 50 mA (VGS = adjust),
f = 520 MHz, Pi = 20 mW,
GP
630 ⎯
45
⎯
14.9 ⎯
⎯ mW
⎯
%
⎯
dB
VDS = 6.0 V,
POL
Iidle = 50 mA (VGS = adjust),
f = 520 MHz, Pi = 20 mW,
500 ⎯
⎯ mW
Note 2: These characteristic values are measured using measurement tools specified by Toshiba.
Output Power Test Fixture
(Test Condition: f = 520 MHz, VDS = 7.2 V, Iidle = 50 mA, Pi = 20 mW)
C5
Pi
ZG = 50 Ω C1 C2
L1
L3
C7
C8
R1
L4
C9
L2
C3 C4
C10
C6
PO
ZL = 50 Ω
VGS
VDS
C1: 10 pF
C2: 10 pF
C3: 9 pF
C4: 6 pF
C5: 2200 pF
C6: 2200 pF
C7: 10 µF
C8: 10000 pF
C9: 10 µF
C10: 10000 pF
L1: φ0.8 mm enamel wire, 2.2ID, 1T
L2: φ0.8 mm enamel wire, 2.2ID, 1T
L3: φ0.8 mm enamel wire, 5.5ID, 4T
L4: φ0.8 mm enamel wire, 5.5ID, 8T
R1: 1.5 kΩ
2
2007-2-19