TA1276AN Datasheet, PDF (16/86 Pages) Toshiba Semiconductor – TOSHIBA BIPOLAR LINEAR INTEGRATED CIRCUIT SILICON MONOLITHIC

ITEM
TEST
RGB-γ
B.L.C.
B.S.G.
B.D.L.
BS-ARE
DYNAMIC ABL POINT
DYNAMIC ABL GAIN
AKB MODE
ABL POINT
ABL GAIN
RGB OUT MODE
HD-OUT
V-BLK
VERTICAL FREQUENCY
VERTICAL POSITION
Y-DL
C-TRAP
TOF-f₀
TOF-Q
EXPLAIN
Test mode ; (0) : NORMAL
(1) : Test mode (For factory test)
Switched by sub-address 17H
<during gate-pulse> D₂ (0) : during V-BLK, (1) : NORMAL
Y / RGB smoothing OFF, Monitor of DAC at HD output
RGB-γ SW ; (0) : OFF, (1) : ON
Block level automatic correction (Priority over black stretcher) ;
MAX 7.5IRE (0) : OFF, (1) : ON
Black stretcher gain SW ; (0) ON, (1) : OFF
Black detection SW ; (0) : 3IRE, (1) : 0IRE
Black area reinforcement SW ;
For wide TV (When using time axis compression IC)
(0) : ON, (1) : OFF
Dynamic ABL detection voltage ; (000) : MIN~(111) : MAX
Dynamic ABL sensitivity ; (000) : MIN~(111) : MAX
AKB MODE ; Only black level
(00) : AKB OFF+S / H LOW, (01) : AKB OFF+Cutoff BUS
(10) : AKB ON+I-DET NORMAL, (11) : AKB ON+I-DET×3
ABL detect voltage ; (000) : MIN~(111) : MAX
ABL GAIN ; (000) : MIN~(111) : MAX
RGB output mode SW ;
(00) : NORMAL, (01) : Only R, (10) : Only G, (11) : Only B
HD output SW ; (0) : HD output, (1) : AKB period pulse
Vertical Blanking SW ; (0) : ON, (1) : OFF
Vertical Frequency ;
(000) : AUTO (50, 60Hz),
(001) : AUTO (50, 60Hz / V MASK OFF),
(010) : 60Hz,
(011) : 60Hz (V MASK OFF),
(100) : Forced 262.5H,
(101) : Forced 263H,
(110) : Forced 312.5H,
(111) : Forced 313H,
When (100), (101), (110), (111) : AFC Free-run
Vertical position ; (000) : 0H~(111) : 7H (1H STEP)
Y-DL SW ; (0) OFF, (1) : ON (+80ns)
Chroma Trap SW ; (0) : OFF, (1) : ON
Selectable TOF Peak Frequency ;
(000) : 0.8f_sc+TOF OFF~(111) : 1.5f_sc
Selectable TOF Q ; (000) : 0.6~(111) : 1.2
TA1276AN
PRESET
NORMAL
OFF
OFF
ON
3IRE
ON
MIN
MIN
(00)
AKB OFF+
S / H LOW
MIN
MIN
NORMAL
HD output
ON
(000)
AUTO
0H
OFF
OFF
TOF OFF
0.6
16
2002-03-29