TLP168J_07 Datasheet, PDF (1/5 Pages) Toshiba Semiconductor – Photocoupler GaAℓAs IRed & Photo-Triac

TOSHIBA Photocoupler GaAℓAs IRed & Photo-Triac
TLP168J
TLP168J
Triac Drive
Programmable Controllers
AC−Output Module
Solid State Relay
Unit in mm
The TOSHIBA mini flat coupler TLP168J is a small outline coupler,
suitable for surface mount assembly.
The TLP168J consists of a photo triac, optically coupled to a GaAℓAs
infrared emitting diode.
• Zero−voltage crossing turn−on
• Peak off−state voltage: 600 V (min.)
• Trigger LED current: 3 mA (max.)
• On−state current: 70 mA (max.)
• Isolation voltage: 2500 Vrms (min.)
Absolute Maximum Ratings (Ta = 25°C)
Characteristic
Symbol
Rating
Unit
Forward current
Forward current derating
(Ta ≥ 25°C)
Peak forward current
(100μs pulse, 100 pps)
Reverse voltage
Junction temperature
Off− state output terminal
voltage
I_F
ΔI_F / °C
I_FP
V_R
T_j
V_DRM
20
mA
TOSHIBA
11−4C3
−0.2
mA / °C
Weight: 0.09 g
1
A
5
V
Pin Configurations
125
°C
1
6
600
V
On−state RMS
current
Ta=25°C
70
I_T(RMS)
mA
Ta=70°C
40
3
zc
4
On−state current derating
(Ta ≥ 25°C)
Peak on−state current
(100μs pulse, 120 pps)
Peak nonrepetitive surge
current (PW=10ms, DC=10%)
ΔI_T / °C
I_TP
I_TSM
−0.67
2
1.2
mA / °C
A
A
1: Anode
3: Cathode
4: Terminal 1
6: Terminal 2
Junction temperature
Storage temperature range
Operating temperature range
Lead soldering temperature (10s)
Isolation voltage
(AC, 1 min., R.H. ≤ 60%)
(Note)
T_j
T_stg
T_opr
T_sol
BV_S
115
−55~125
−40~100
260
2500
°C
°C
°C
°C
Vrms
Note:
Using continuously under heavy loads (e.g. the application of high temperature/current/voltage and the
significant change in temperature, etc.) may cause this product to decrease in the reliability significantly
even if the operating conditions (i.e. operating temperature/current/voltage, etc.) are within the absolute
maximum ratings.
Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook
(“Handling Precautions”/“Derating Concept and Methods”) and individual reliability data (i.e. reliability test
report and estimated failure rate, etc).
(Note) Device considered a two terminal device: Pins 1 and 3 shorted together and pins 4 and 6 shorted together.
1
2007-10-01