RN1961FS Datasheet, PDF (1/8 Pages) Toshiba Semiconductor – Switching, Inverter Circuit, Interface Circuit and Driver Circuit Applications

RN1961FS~RN1966FS
TOSHIBA Transistor Silicon NPN Epitaxial Type (PCT process) (Bias Resistor built-in Transistor)
RN1961FS,RN1962FS,RN1963FS
RN1964FS,RN1965FS,RN1966FS
Switching, Inverter Circuit, Interface Circuit and
Driver Circuit Applications
• Two devices are incorporated into a fine pitch Small Mold (6 pin)
package.
• Incorporating a bias resistor into a transistor reduces parts count.
Reducing the parts count enable the manufacture of ever more
compact equipment and save assembly cost.
• Complementary to RN2961FS~RN2966FS
0.1±0.05
Unit: mm
1.0±0.05
0.8±0.05
0.1±0.05
1
6
2
5
3
4
Equivalent Circuit and Bias Resistor Values
C
R1
B
E
Type No.
RN1961FS
RN1962FS
RN1963FS
RN1964FS
RN1965FS
RN1966FS
R1 (kΩ)
4.7
10
22
47
2.2
4.7
R2 (kΩ)
4.7
10
22
47
47
47
1.EMIITTER1 (E1)
2.EMITTER2
(E2)
3.BASE2
(B2)
4.COLLECTOR2 (C2)
5.BASE1
(B1)
fS6 ^{6.COLLECTOR1 (C1)}
JEDEC
―
JEITA
―
TOSHIBA
2-1F1C
Weight: 0.001 g (typ.)
Absolute Maximum Ratings (Ta = 25°C)
(Q1, Q2 common)
Characteristics
Symbol
Rating
Unit
Equivalent Circuit
(top view)
654
Collector-base voltage
RN1961FS~
V_CBO
20
V
Collector-emitter voltage
1966FS
V_CEO
20
V
RN1961FS~
1964FS
10
Emitter-base voltage
RN1965FS,
1966FS
V_EBO
5
V
Collector current
I_C
50
mA
Collector power dissipation _RN1961FS~ P_C (Note 1)
50
mW
Junction temperature
RN1966FS
T_j
150
°C
Storage temperature range
T_stg
−55~150
°C
Q1
Q2
123
Note:
Using continuously under heavy loads (e.g. the application of high temperature/current/voltage and the
significant change in temperature, etc.) may cause this product to decrease in the reliability significantly
even if the operating conditions (i.e. operating temperature/current/voltage, etc.) are within the absolute
maximum ratings.
Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook
(“Handling Precautions”/“Derating Concept and Methods”) and individual reliability data (i.e. reliability test
report and estimated failure rate, etc).
Note 1: Total rating
1
2007-11-01