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HN7G07FU Datasheet, PDF (1/6 Pages) Toshiba Semiconductor – Power Management Switch Applications, Inverter Circuit Applications, Driver Circuit Applications and Interface Circuit Applications
TOSHIBA Multichip Discrete Device
HN7G07FU
HN7G07FU
Power Management Switch Applications, Inverter Circuit
Applications, Driver Circuit Applications and Interface
Circuit Applications
Unit: mm
• Combining transistor and BRT reduces the parts count, enabling the
design of more compact equipment with a simpler system configuration.
Q1: 2SC5376F equivalent
Q2: RN1115F equivalent
Q1 Absolute Maximum Ratings (Ta = 25°C)
Characteristic
Collector-base voltage
Collector-emitter voltage
Emitter-base voltage
Collector current
Base current
Symbol
VCBO
VCEO
VEBO
IC
IB
Rating
Unit
15
V
12
V
5
V
500
mA
50
mA
Q2 Absolute Maximum Ratings (Ta = 25°C)
Characteristic
Collector-base voltage
Collector-emitter voltage
Emitter-base voltage
Collector current
Symbol
VCBO
VCEO
VEBO
IC
Rating
Unit
50
V
50
V
10
V
100
mA
Q1, Q2 Common Ratings (Ta = 25°C)
1.EMITTER1
(E1)
2.BASE1
(B1)
3.COLLECTOR2 (C2)
4.EMITTER2
(E2)
5.BASE2
(B2)
6.COLLECTOR1 (C1)
JEDEC
―
JEITA
―
TOSHIBA
2-2J1A
Weight: 0.0068 g (typ.)
Marking
Type Name
hFE Rank
75A
Characteristic
Symbol
Rating
Unit
Collector power dissipation
Junction temperature
PC*
200
mW
Equivalent Circuit
Tj
150
°C
(top view)
Storage temperature range
Tstg
−55~150
°C
Note: Using continuously under heavy loads (e.g. the application of high
65
4
temperature/current/voltage and the significant change in temperature,
etc.) may cause this product to decrease in the reliability significantly even
if the operating conditions (i.e. operating temperature/current/voltage, etc.)
Q2
are within the absolute maximum ratings.
Q1
Please design the appropriate reliability upon reviewing the Toshiba
Semiconductor Reliability Handbook (“Handling Precautions”/“Derating
Concept and Methods”) and individual reliability data (i.e. reliability test
12
3
report and estimated failure rate, etc).
*: Total rating. 130 mW per element should not be exceeded.
1
2007-11-01