HN2E01F_07 Datasheet, PDF (1/7 Pages) Toshiba Semiconductor – MULTI CHIP DISCRETE DEVICE Super High Speed Switching Application

TOSHIBA MULTI CHIP DISCRETE DEVICE
HN2E01F
HN2E01F
Super High Speed Switching Application
Audio Frequency Amplifier Application
General Switching Application
Q1
Low Forward Voltage Drop
Fast Reverse Recovery Time
Low Total Capacitance
Q2
High DC Current Gain
High Voltage
High Collector Current
: V_F(3)=0.98V(typ.)
: t_rr=1.6ns(typ.)
: C_T=0.5pF(typ.)
: h_FE=600~3600
: V_CEO=50V
: I_C=150mA(max.)
Unit: mm
Q1 (Diode)
Q2 (Transistor)
: 1SS352 Equivalent
: 2SC4666 Equivalent
Q1 (Diode) Absolute Maximum Ratings (Ta = 25°C)
Characteristic
Maximum (peak) reverse voltage
Reverse voltage
Maximum (peak) forward current
Average forward current
Surge current (10ms)
Symbol
V_RM
V_R
I_FM
I_O
I_FSM
Rating
Unit
85
V
80
V
300
mA
100
mA
1
A
1.Anode
2.Base
3.Collector
4.Emitter
5.NC
6.Cathode
JEDEC
―
JEITA
―
TOSHIBA
2-3N1D
Weight: 0.015g (typ.)
Q2 (Transistor) Absolute Maximum Ratings (Ta = 25°C)
Characteristic
Symbol
Rating
Unit
Collector-base voltage
Collector-emitter voltage
Emitter-base voltage
Collector current
Base current
V_CBO
V_CEO
V_EBO
I_C
I_B
50
V
50
V
5
V
150
mA
30
mA
Absolute Maximum Ratings (Ta = 25°C) (Q1, Q2 Common)
Characteristic
Collector power dissipation
Junction temperature
Storage temperature range
Symbol
Rating
Unit
P_C*
300
mW
T_j
125
°C
T_stg
−55~125
°C
Note: Using continuously under heavy loads (e.g. the application of high temperature/current/voltage and the
significant change in temperature, etc.) may cause this product to decrease in the reliability significantly even if
the operating conditions (i.e. operating temperature/current/voltage, etc.) are within the absolute maximum
ratings.
Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook
(“Handling Precautions”/“Derating Concept and Methods”) and individual reliability data (i.e. reliability test
report and estimated failure rate, etc).
* Total rating: 200mW per element should not be exceeded.
1
2007-11-22