TNETE2201B_14 Datasheet, PDF (9/28 Pages) Texas Instruments – 1.25-GIGABIT ETHERNET TRANSCEIVER

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TNETE2201B
1.25ĆGIGABIT ETHERNET TRANSCEIVER
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SLLS367D − JUNE 1999 − REVISED AUGUST 2007
loop-back testing
The transceiver can provide a self-test function by enabling (LOOPEN to high level) the internal loop-back path.
Enabling LOOPEN causes serially transmitted data to be routed internally to the receiver. The parallel data
output can be compared to the parallel input data for functional verification. The external differential output is
held in a static state during loop-back testing.
absolute maximum ratings^†
Supply voltage, V_CC (see Note 2) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . −0.5 to 4.0 V
Input voltage, V_I (TTL, PECL) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . −0.5 to 4.0 V
Output current I_O, (TTL) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 50 mA
Output current I_O, (PECL) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . −50 mA
Voltage range at any terminal . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . −0.5 to V_CC + 0.5 V
Electrostatic discharge, 5-V tolerant input terminals (see Note 3) . . . . . . . . . . . . . . Class 1, A:1 kV, B:150 V
Electrostatic discharge, all other terminals (see Note 3) . . . . . . . . . . . . . . . . . . . . . . Class 1, A:2 kV, B:200 V
Characterized free-air operating temperature range . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 0°C to 70°C
Storage temperature . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . −65°C to 150°C
† _{Stresses beyond those listed under “absolute maximum ratings” may cause permanent damage to the device. These are stress ratings only, and}
functional operation of the device at these or any other conditions beyond those indicated under “recommended operating conditions” is not
implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
NOTES: 2. All voltage values, except differential I/O bus voltages, are with respect to network ground.
3. This parameter is tested in accordance with MIL-PRF-38535.
recommended operating conditions
PARAMETER
TEST CONDITIONS
MIN NOM MAX UNIT
Supply voltage, VCC
Supply current, ICC (static)
Power dissipation, PD (static)
Static pattern†
Outputs open,
Static pattern†
Supply current, ICC (dynamic)
K28.5
Power dissipation, PD (dynamic)
Outputs open,
K28.5
Operating free-air temperature, TA
† _{Power (static pattern) = 125 MHz to the receiver and 5 ones and 5 zeros to the transmitter.}
3.14 3.3 3.47 V
180 260 mA
590 900 mW
240 330 mA
790 1150 mW
0
70 °C
reference clock (REFCLK) timing requirements over recommended operating conditions (unless
otherwise noted)^†
PARAMETER
TEST CONDITIONS
MIN NOM MAX UNIT
Frequency
TYP −
0.01%
125
TYP +
0.01%
MHz
Accuracy
−100
100 ppm
Duty cycle
40% 50% 60%
Jitter
Random and deterministic
40
ps
† _{This clock should be crystal referenced to meet the requirements of the this table. The maximum rate of frequency change specified is valid after}
10 seconds from power on.
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