TLC354_14 Datasheet, PDF (9/18 Pages) Texas Instruments – LinCMOSE QUADRUPLE DIFFERENTIAL COMPARATORS

TLC354
LinCMOS™ QUADRUPLE DIFFERENTIAL COMPARATORS
SLCS116B – SEPTEMBER 1985 – REVISED FEBRUARY 1997
PARAMETER MEASUREMENT INFORMATION
Response time is defined as the interval between the application of an input step function and the instant when the
output reaches 50% of its maximum value. Response time, low-to-high-level output, is measured from the trailing
edge of the input pulse. Response-time measurement at low input signal levels can be greatly affected by the input
offset voltage. The offset voltage should be balanced by the adjustment at the inverting input (as shown in Figure 3)
so that the circuit is just at the transition point. Then a low signal, for example, 105-mV or 5-mV overdrive, causes
the output to change.
VDD
Pulse Generator
1V
Input
Offset Voltage
10 Ω
Compensation
10 Turn
Adjustment
–1 V
50 Ω
1 kΩ
OUT
0.1 µF
5.1 kΩ
1 µF
CL
(see Note A)
Overdrive
Input
TEST CIRCUIT
100 mV
Input
Overdrive
100 mV
Low-to-High-
Level Ouptut
50%
tPLH
90%
10%
tr
High-to-Low-
Level Ouptut
90%
50%
10%
tf
tPLH
VOLTAGE WAVEFORMS
NOTE A: CL includes probe and jig capacitance.
Figure 3. Response, Rise, and Fall Times Test Circuit and Voltage Waveforms
• POST OFFICE BOX 655303 DALLAS, TEXAS 75265
9