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THS4541 Datasheet, PDF (9/62 Pages) Texas Instruments – Fully Differential Amplifier | |||
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THS4541
SLOS375 â AUGUST 2014
Electrical Characteristics: Vs+ â Vsâ = 3 V (continued)
At TA â 25°C, Vocm = open (defaults midsupply), VOUT = 2 VPP, Rf = 402 Ω, Rload = 499 Ω, 50-Ω input match, G = 2 V/V,
single-ended input, differential output, and PD = +Vs, unless otherwise noted. See Figure 61 for an ac-coupled gain of a
2-V/V test circuit, and Figure 63 for a dc-coupled gain of a 2-V/V test circuit.
PARAMETER
TEST CONDITIONS
TEST
MIN
TYP
MAX UNIT
LEVEL (1)
DC PERFORMANCE
AOL
Open-loop voltage gain
Input-referred offset voltage
Input offset voltage drift(3)
Input bias current
(positive out of node)
Input bias current drift(3)
Input offset current
INPUT
Input offset current drift(3)
TA = 25°C
TA = 0°C to 70°C
TA = â40°C to 85°C
TA = â40°C to 125°C
TA = â40°C to 125°C
TA = 25°C
TA = 0°C to 70°C
TA = â40°C to 85°C
TA = â40°C to 125°C
TA = â40°C to 125°C
TA = 25°C
TA = 0°C to 70°C
TA = â40°C to 85°C
TA = â40°C to 125°C
TA = â40°C to 125°C
100
119
dB
A
â450
±100
400
µV
A
â600
±100
600
µV
B
â700
±100
700
µV
B
â850
±100
850
µV
B
â2.4
±0.5
2.4 µV/°C
B
4.1
9
12
µA
A
4.1
9
12.5
µA
B
4.1
9
13
µA
B
4.1
9
13.5
µA
B
â5
15 nA/°C
B
â500
±150
500
nA
A
â550
±150
550
nA
B
â580
±150
580
nA
B
â620
±150
620
nA
B
â1.3
±0.3
1.3 nA/°C
B
Common-mode input low
< 3-dB degradation in TA = 25°C
CMRR from
midsupply
TA = â40°C to 125°C
Vsâ â 0.2 Vsâ â 0.1
V
A
Vsâ â 0.1
Vsâ
V
B
Common-mode input high
< 3-dB degradation in TA = +25°C
CMRR from
midsupply
TA = â40°C to 125°C
Vs+ â 1.3
Vs+ â 1.3
Vs+ â1.2
V
A
V
B
Common-mode rejection ratio
Input pins at (Vs+ â Vsâ) / 2
85
100
dB
A
Input impedance differential mode Input pins at (Vs+ â Vsâ) / 2
110 || 0.85
kΩ || pF
C
OUTPUT
Output voltage low
TA = 25°C
TA = â40°C to 125°C
Vsâ + 0.2
Vsâ +
0.25
V
A
Vsâ + 0.2
Vsâ +
0.25
V
B
Output voltage high
TA = 25°C
TA = â40°C to 125°C
Vs+ â
0.25
Vs+ â
0.25
Vs+ â 0.2
Vs+ â 0.2
V
A
V
B
Output current drive
TA = 25°C
TA = â40°C to 125°C
±55
±60
±55
mA
A
mA
B
(3) Input offset voltage drift, input bias current drift, input offset current drift, and Vocm drift are average values calculated by taking data at
the at the maximum-range ambient-temperature end points, computing the difference, and dividing by the temperature range. Maximum
drift set by distribution of a large sampling of devices. Drift is not specified by test or QA sample test.
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