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BQ27741-G1_14 Datasheet, PDF (9/39 Pages) Texas Instruments – Single Cell Li-Ion Battery Fuel Gauge with Integrated Protection
bq27741-G1
www.ti.com
SLUSBF2 – JULY 2013
Integrating ADC (Coulomb Counter) Characteristics
TA = –40°C to 85°C, 2.4 V < VREG25 < 2.6 V; typical values at TA = 25°C and VREG25 = 2.5 V (unless otherwise noted)
PARAMETER
TEST CONDITIONS
MIN
TYP
MAX UNIT
VSR_IN
tSR_CONV
Input voltage range, VSRN and VSRP VSR = VSRN – VSRP
Conversion time
Single conversion
Resolution
VVPWR – 0.125
14
VVPWR + 0.125
V
1
s
15 bits
VSR_OS
INL
ZSR_IN
ISR_LKG
Input offset
Integral nonlinearity error
Effective input resistance(1)
Input leakage current(1)
10
±0.007
7
±0.034
0.3
μV
%FSR
MΩ
μA
(1) Assured by design. Not production tested.
ADC (Temperature and Cell Voltage) Characteristics
TA = –40°C to 85°C, 2.4 V < VREG25 < 2.6 V; typical values at TA = 25°C and VREG25 = 2.5 V (unless otherwise noted)
PARAMETER
TEST CONDITIONS
MIN
TYP
MAX
VADC_IN
tADC_CONV
Input voltage range (VBAT channel)
Input voltage range (other channels)
Conversion time
Resolution
VSS – 0.125
5
VSS – 0.125
1
125
14
15
VADC_OS
ZADC1
ZADC2
IADC_LKG
Input offset
Effective input resistance (TS) (1)
Effective input resistance (BAT)(1)
Input leakage current(1)
Not measuring cell voltage
Measuring cell voltage
1
55
55
100
0.3
UNIT
V
V
ms
bits
mV
MΩ
MΩ
kΩ
μA
(1) Assured by design. Not production tested.
Data Flash Memory Characteristics
TA = –40°C to 85°C, 2.4 V < VREG25 < 2.6 V; typical values at TA = 25°C and VREG25 = 2.5 V (unless otherwise noted)
PARAMETER
TEST CONDITIONS
MIN
TYP
MAX
tDR
Data retention(1)
Flash programming write-cycles (1)
10
20,000
tWORDPROG
ICCPROG
Word programming time(1)
Flash-write supply current(1)
2
5
10
UNIT
years
cycles
ms
mA
(1) Assured by design. Not production tested.
Copyright © 2013, Texas Instruments Incorporated
Product Folder Links: bq27741-G1
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