BQ76PL455A-Q1 Datasheet, PDF (66/130 Pages) Texas Instruments – 16-Cell EV/HEV Integrated Battery Monitor and Protector

bq76PL455A-Q1
SLUSC51B – APRIL 2015 – REVISED DECEMBER 2015
www.ti.com
Register Maps (continued)
7.6.2 Register Summary
KEY: ADDR = Address; R = Read; W = Write; R/W = Read/Write;EE = EEPROM: NA = value is volatile storage
only and not included in the EEPROM; '-' indicates the location is reserved for future use; (hex value) indicates
the default value programmed into the EEPROM location, that will be copied to the associated volatile register
upon successful reset initialization; CSUM = Checksum: Y = value included in checksum calculation; N = value
not included in calculation.
ADDR
HEX
00–01
02
03–06
07
08–09
0A
0B
0C
0D
0E
0F
10–11
12
13
14–15
16–1D
1E–1F
20–21
22–24
25
26–27
28
29–2B
2C–31
32
33–36
37
38–3C
3D
3E
3F–42
43–44
45–4F
50
51
52–53
54–55
56–57
58–59
5A–5B
ADDR
DECIMAL
0–1
2
3–6
7
8–9
10
11
12
13
14
15
16–17
18
19
20–21
22–29
30–31
32–33
34–36
37
38–39
40
41–43
44–49
50
51–54
55
56–60
61
62
63–66
67–68
69–79
80
81
82–83
84–85
86–87
88–89
90–91
BITS
16
8
32
8
16
8
8
8
8
8
8
16
8
8
16
64
16
16
24
8
16
8
24
40
8
32
8
40
8
8
32
16
88
8
8
16
16
16
16
16
Table 7. Register Summary
NAME
DESCRIPTION
SREV
CMD
CHANNELS
OVERSMPL
RESERVED
ADDR
GROUP_ID
DEV_CTRL
NCHAN
DEVCONFIG
PWRCONFIG
COMCONFIG
TXHOLDOFF
CBCONFIG
CBENBL
RESERVED
TSTCONFIG
TESTCTRL
TEST_ADC
TESTAUXPU
RESERVED
CTO
CTO_CNT
RESERVED
AM_PER
AM_CHAN
AM_OSMPL
RESERVED
SMPL_DLY1
CELL_SPER
AUX_SPER
TEST_SPER
RESERVED
SHDN_STS
STATUS
FAULT_SUM
FAULT_UV
FAULT_OV
FAULT_AUX
FAULT_2UV
Silicon Revision
Command
Command channel select
Command averaging (oversampling)
Reserved for future use
Device address
(Device) Group Identifier
Device control
Number of channels enabled for conversion
Device configuration
Power configuration
Communications configuration
UART Transmitter holdoff
Cell balancing (equalization) configuration
Cell balancing enables
Reserved for future use
Built-In Self-Test (BIST) configuration
BIST control
ADC BIST control
Test control—AUX pull-up resistors
Reserved for future use
Communications time-out
Communications time-out counter
Reserved for future use
Auto-monitor period
Auto-monitor channel select
Auto-monitor averaging
Reserved for future use
Initial sampling delay
Cell and die temperature measurement period
AUX channels sampling period
ADC test sampling period
Reserved for future use
Shutdown recovery status
Device status
Fault summary
Undervoltage faults
Overvoltage faults
AUX threshold exceeded faults
Comparator UV faults
DEFAULT (HEX)
RAM⁽¹⁾
EE⁽²⁾
0806
N/A
00
N/A
0000
0000
FFFF
0000
00
7B
00
—
00
00
00
00
20
N/A
00
10
00
10
00
80
1000
1080
00
00
00
00
0000
N/A
00
—
0000
N/A
0000
N/A
0000
N/A
00
N/A
00
—
00
DC
0000
N/A
0000
—
00
0
0000
0000
00
00
0000
—
00
0
00
BC
0000
0000
4444
4444
0000
F999
00
—
00
N/A
81⁽⁴⁾
N/A
0100⁽⁴⁾
N/A
0000⁽⁴⁾
N/A
0000⁽⁴⁾
N/A
0000⁽⁴⁾
N/A
0000⁽⁴⁾
N/A
R/W CSUM⁽³⁾
R
N
W
N
R/W
Y
R/W
Y
R/W
N
R/W
Y
R/W
Y
R/W
N
R/W
Y
R/W
Y
R/W
Y
R/W
Y
R/W
Y
R/W
Y
R/W
Y
R/W
N
R/W
Y
R/W
N
R/W
Y
R/W
Y
R/W
N
R/W
Y
R/W
N
R/W
N
R/W
Y
R/W
Y
R/W
Y
R/W
N
R/W
Y
R/W
Y
R/W
Y
R/W
Y
R/W
N
R
N
R/W
N
R/W
N
R/W
N
R/W
N
R/W
N
R/W
N
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