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TLC0820A Datasheet, PDF (6/15 Pages) Texas Instruments – Advanced LinCMOSE HIGH-SPEED 8-BIT ANALOG-TO-DIGITAL CONVERTERS USING MODIFIED FLASH TECHNIQUES
TLC0820AC, TLC0820AI
Advanced LinCMOS™ HIGH-SPEED 8-BIT ANALOG-TO-DIGITAL
CONVERTERS USING MODIFIED FLASH TECHNIQUES
SLAS064A – SEPTEMBER 1986 – REVISED JUNE 1994
operating characteristics, VCC = 5 V, Vref+ = 5 V, Vref– = 0, tr = tf = 20 ns, TA = 25°C (unless otherwise
noted)
PARAMETER
TEST CONDITIONS†
MIN
TYP
MAX UNIT
kSVS
tconv(R)
Supply-voltage sensitivity
Total unadjusted error‡
Conversion time, read mode
ta(R)
Access time, RD↓ to data valid
VCC = 5 V ± 5%,
MODE at 0 V,
MODE at 0 V,
TA = MIN to MAX
TA = MIN to MAX
See Figure 1
MODE at 0 V,
See Figure 1
± 1/16
± 1/4 LSB
1 LSB
1.6
2.5 µs
tconv(R) tconv(R)
+ 20
+ 50
ns
ta(R1) Access time, RD↓ to data valid
MODE at 5 V,
td(WR) < td(int),
See Figure 2
CL = 15 pF
CL = 100 pF
190
280
ns
210
320
ta(R2) Access time, RD↓ to data valid
MODE at 5 V,
td(WR) > td(int),
See Figure 3
CL = 15 pF
CL = 100 pF
70
120
ns
90
150
ta(INT)
tdis
Access time, INT↓ to data valid
Disable time, RD↑ to data valid
MODE at 5 V,
See Figure 4
RL = 1 kΩ,
CL = 10 pF,
See Figures 1, 2, 3, and 5
20
50 ns
70
95 ns
td(int) Delay time, WR/RDY↑ to INT↓
MODE at 5 V,
CL = 50 pF,
See Figures 2, 3, and 4
800
1300 ns
td(NC) Delay time, to next conversion
See Figures 1, 2, 3, and 4
500
ns
td(WR)
Delay time, WR/RDY↑ to RD↓ in
write-read mode
See Figure 2
0.4
µs
td(RDY) Delay time, CS↓ to WR/RDY↓
MODE at 0 V,
See Figure 1
CL = 50 pF,
50
100 ns
td(RIH)
td(RIL)
Delay time, RD↑ to INT↑
Delay time, RD↓ to INT↓
CL = 50 pF,
MODE at 5 V,
See Figure 2
See Figures 1, 2, and 3
td(WR) < td(int),
125
225 ns
200
290 ns
td(WIH) Delay time, WR/RDY↑ to INT↑
MODE at 5 V,
See Figure 4
CL = 50 pF,
175
270 ns
Slew-rate tracking
0.1
† For conditions shown as MIN or MAX, use the appropriate value specified under recommended operating conditions.
‡ Total unadjusted error includes offset, full-scale, and linearity errors.
V/µs
2–6
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