NN325-Q1 Datasheet, PDF (6/73 Pages) Texas Instruments – Multisensing Touch Manager

NN325-Q1
SLAS824 – DECEMBER 2013
TERMINAL
NAME
P4.5/TB2/A14
P4.6/TBOUTH/A15
P4.7/TBCLK
RST/NMI/SBWTDIO
TEST/SBWTCK
DV_CC
AV_CC
DV_SS
AV_SS
QFN Pad
Table 1. Terminal Functions (continued)
www.ti.com
NO.
RHA
20
I/O
DESCRIPTION
General-purpose digital I/O pin
I/O ^{Timer_B, compare: OUT2 output}
ADC10 analog input A14
General-purpose digital I/O pin
21
I/O ^{Timer_B, switch all TB0 to TB3 outputs to high impedance}
ADC10 analog input A15
General-purpose digital I/O pin
22 I/O
Timer_B, clock signal TBCLK input
Reset or nonmaskable interrupt input
5
I
Spy-Bi-Wire test data input/output during programming and test
Selects test mode for JTAG pins on Port 1. The device protection fuse is connected to
37
I ^TEST.
Spy-Bi-Wire test clock input during programming and test
38, 39
Digital supply voltage
14
Analog supply voltage
1, 4
Digital ground reference
13
Analog ground reference
Pad NA QFN package pad; connection to DV_SS recommended.
6
Submit Documentation Feedback
Product Folder Links: NN325-Q1
Copyright © 2013, Texas Instruments Incorporated