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NN325-Q1 Datasheet, PDF (36/73 Pages) Texas Instruments – Multisensing Touch Manager
NN325-Q1
SLAS824 – DECEMBER 2013
www.ti.com
USCI (UART Mode)
over recommended ranges of supply voltage and operating free-air temperature (unless otherwise noted)
fUSCI
PARAMETER
USCI input clock frequency
CONDITIONS
Internal: SMCLK, ACLK
External: UCLK
Duty cycle = 50% ± 10%
VCC
MIN TYP MAX UNIT
fSYSTEM MHz
fBITCLK
BITCLK clock frequency
(equals baud rate in MBaud)
2.2 V, 3 V
1 MHz
tτ
UART receive deglitch time(1)
2.2 V
3V
50 150
50 100
600
ns
600
(1) Pulses on the UART receive input (UCxRX) shorter than the UART receive deglitch time are suppressed. To ensure that pulses are
correctly recognized their width should exceed the maximum specification of the deglitch time.
USCI (SPI Master Mode)(1)
over recommended ranges of supply voltage and operating free-air temperature (unless otherwise noted)
(see Figure 20 and Figure 21)
fUSCI
PARAMETER
USCI input clock frequency
TEST CONDITIONS
SMCLK, ACLK
Duty cycle = 50% ± 10%
VCC
MIN TYP MAX UNIT
fSYSTEM MHz
tSU,MI
SOMI input data setup time
2.2 V
110
ns
3V
75
tHD,MI
SOMI input data hold time
2.2 V
0
ns
3V
0
tVALID,MO SIMO output data valid time
UCLK edge to SIMO valid,
CL = 20 pF
2.2 V
3V
30
ns
20
(1) fUCxCLK = 1/2tLO/HI with tLO/HI ≥ max(tVALID,MO(USCI) + tSU,SI(Slave), tSU,MI(USCI) + tVALID,SO(Slave)).
For the slave's parameters tSU,SI(Slave) and tVALID,SO(Slave), see the SPI parameters of the attached slave.
USCI (SPI Slave Mode)(1)
over recommended ranges of supply voltage and operating free-air temperature (unless otherwise noted)
(see Figure 22 and Figure 23)
tSTE,LEAD
tSTE,LAG
tSTE,ACC
tSTE,DIS
PARAMETER
STE lead time, STE low to clock
STE lag time, Last clock to STE high
STE access time, STE low to SOMI data out
STE disable time, STE high to SOMI high
impedance
TEST CONDITIONS
VCC
2.2 V, 3 V
2.2 V, 3 V
2.2 V, 3 V
2.2 V, 3 V
MIN TYP
50
10
50
50
tSU,SI
SIMO input data setup time
2.2 V
20
3V
15
tHD,SI
SIMO input data hold time
2.2 V
10
3V
10
tVALID,SO SOMI output data valid time
UCLK edge to SOMI valid,
2.2 V
75
CL = 20 pF
3V
50
(1) fUCxCLK = 1/2tLO/HI with tLO/HI ≥ max(tVALID,MO(Master) + tSU,SI(USCI), tSU,MI(Master) + tVALID,SO(USCI)).
For the master's parameters tSU,MI(Master) and tVALID,MO(Master), see the SPI parameters of the attached slave.
MAX
UNIT
ns
ns
ns
ns
ns
ns
110
ns
75
36
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