LP2998 Datasheet, PDF (6/33 Pages) Intersil Corporation – DDR-II and DDR-I Termination Regulator

LP2998, LP2998-Q1
SNVS521K – DECEMBER 2007 – REVISED AUGUST 2014
www.ti.com
7.6 Electrical Characteristics
Typical limits tested at T_J = 25°C. Minimum and maximum limits apply over the full operating junction temperature range (T_J =
–40°C to 125°C).⁽¹⁾ Unless otherwise specified, AVIN = PVIN = 2.5 V, VDDQ = 2.5 V.⁽²⁾
PARAMETER
TEST CONDITIONS
MIN
TYP
MAX UNIT
VIN = VDDQ = 2.3 V
1.135
1.158
1.185
V_REF voltage (DDR I)
VIN = VDDQ = 2.5 V
VIN = VDDQ = 2.7 V
1.235
1.335
1.258
1.358
1.285
1.385
PVIN = VDDQ = 1.7 V
0.837
0.860
0.887
V_REF
V_REF voltage (DDR II)
PVIN = VDDQ = 1.8 V
PVIN = VDDQ = 1.9 V
0.887
0.936
0.910
0.959
0.937
V
0.986
PVIN = VDDQ = 1.35V
0.669
0.684
0.699
V_REF Voltage (DDR III)
PVIN = VDDQ = 1.5V
PVIN = VDDQ = 1.6V
0.743
0.793
0.758
0.808
0.773
0.823
Z_VREF
V_REF Output Impedance
I_REF = –30 to 30 µA
I_OUT = 0 A
VIN = VDDQ = 2.3 V
1.120
2.5
1.159
kΩ
1.190
VIN = VDDQ = 2.5 V
1.210
1.259
1.290
V_TT
V_TT Output Voltage (DDR I) ⁽³⁾
VIN = VDDQ = 2.7 V
I_OUT = ±1.5 A
VIN = VDDQ = 2.3 V
1.320
1.125
1.359
1.159
1.390
V
1.190
VIN = VDDQ = 2.5 V
1.225
1.259
1.290
VIN = VDDQ = 2.7 V
1.325
1.359
1.390
I_OUT = 0 A, AVIN = 2.5 V
PVIN = VDDQ = 1.7 V
0.822
0.856
0.887
PVIN = VDDQ = 1.8 V
0.874
0.908
0.939
V_TT Output Voltage (DDR II) ⁽³⁾
PVIN = VDDQ = 1.9 V
I_OUT = ±0.5A, AVIN = 2.5 V
PVIN = VDDQ = 1.7 V
0.923
0.820
0.957
0.856
0.988
V
0.890
PVIN = VDDQ = 1.8 V
0.870
0.908
0.940
PVIN = VDDQ = 1.9 V
0.920
0.957
0.990
I_OUT = 0A, AVIN = 2.5 V
PVIN = VDDQ = 1.35V
0.656
0.677
0.698
PVIN = VDDQ = 1.5 V
0.731
0.752
0.773
PVIN = VDDQ = 1.6 V
0.781
0.802
0.823
I_OUT = 0.2 A, AVIN = 2.5V
PVIN = VDDQ = 1.35V
0.667
0.688
0.710
V_TT Output Voltage (DDR III) ⁽³⁾
I_OUT = -0.2A, AVIN = 2.5V
PVIN = VDDQ = 1.35V
I_OUT = 0.4 A, AVIN = 2.5 V
PVIN = VDDQ = 1.5 V
0.641
0.740
0.673
0.763
0.694
V
0.786
I_OUT = –0.4 A, AVIN = 2.5 V
PVIN = VDDQ = 1.5 V
0.731
0.752
0.773
I_OUT = 0.5 A, AVIN = 2.5 V
PVIN = VDDQ = 1.6 V
0.790
0.813
0.836
I_OUT = –0.5 A, AVIN = 2.5 V
PVIN = VDDQ = 1.6 V
0.781
0.802
0.823
(1) Limits are 100% production tested at 25°C. Limits over the operating temperature range are specified through correlation using
Statistical Quality Control (SQC) methods. The limits are used to calculate Texas Instruments' Average Outgoing Quality Level (AOQL).
(2) VIN is defined as VIN = AVIN = PVIN.
(3) V_TT load regulation is tested by using a 10 ms current pulse and measuring V_TT.
6
Submit Documentation Feedback
Copyright © 2007–2014, Texas Instruments Incorporated
Product Folder Links: LP2998 LP2998-Q1