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LMP92018_14 Datasheet, PDF (6/34 Pages) Texas Instruments – LMP92018 Analog System Monitor and Controller | |||
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LMP92018
SNAS514B â NOVEMBER 2011 â REVISED MAY 2013
www.ti.com
Operating Conditions(1)(2)
Operating Ambient Temperature
â40°C to 125°C
VDD Voltage Range
4.75V to 5.25V
VIO Voltage Range
1.8V to VDD
VGPIO Voltage Range
1.8V to VDD
DAC Output Load C
0nF to 1nF
θJA
25.2°C/W
θJC
2.4°C/W
(1) âAbsolute Maximum Ratingsâ indicate limits beyond which damage to the device may occur, including inoperability and degradation of
device reliability and/or performance. Functional operation of the device and/or non-degradation at the Absolute Maximum Ratings or
other conditions beyond those indicated in the Recommended Operating Conditions is not implied. The recommended Operating
Conditions indicate conditions at which the device is functional and the device should not be operated beyond such conditions.
(2) All voltages are measured with respect to GND = 0V, unless otherwise specified.
Electrical Characteristics
Unless otherwise noted, these specifications apply for VDD=4.75V to 5.25V, REF=VDD, TA=25°C. Boldface limits are over
the temperature range of â30°C ⤠TA ⤠85°C unless otherwise noted. DAC input code range 12 to 1012. DAC output
CL = 200 pF unless otherwise noted.
Symbol
Parameter
Conditions
Min
Typ
Max
Units
ADC CHARACTERISTICS
Resolution with No Missing
Codes
10
10
Bits
DNL
Differential Non-Linearity
â0.9
+1
INL
Integral Non-Linearity
â1
1
LSB
OE
Offset Error
â2
+2
OEDRIFT
OEMTCH
GE
Offset Error Temperature Drift
Offset Error Match(1)
Gain Error
0.001
LSB/°C
â1
1
LSB
â2
2
GEDRIFT Gain Error Temperature Drift
GEMTCH Gain Error Match(1)
0.001
LSB/°C
â1
1
LSB
SINAD Signal-to-Noise Ratio
10 kHz Sine Wave
58
THD
Total Harmonic Distortion
10 kHz Sine Wave, up to 5th harmonic
â69
dB
SFDR Spurious Free Dynamic Range
10 kHz Sine Wave
70
dBc
PSRR Power Supply Rejection Ratio
Offset Error change with VDD
Gain Error change with VDD
â150
dB
â150
DAC CHARACTERISTICS
Resolution
10
10
Bits
Monotonicity
10
Bits
DNL
INL
OE
OEDRIFT
FSE
GE
GEDRIFT
Differential Non-Linearity
Integral Non-Linearity
Offset Error(2)
Offset Error Temperature Drift
Full-Scale Error
Gain Error(3)
Gain Error Temperature Drift
ZCO
Zero Code Output
RL = 100k
RL = 100k
RL = 100k
RL = 100k
VDD = 5.25V, REF=5, RL = 100k,
CODE=3FFh
RL = 100k
RL = 100k
IOUT = 200 µA
IOUT = 1mA
â0.5
â2
-0.4
â0.2
+0.5
LSB
+2
10
mV
1
µV/°C
+0.3
+0.2
%FS
1.4
ppm/° C
7
mV
31
(1) Device Specification is guaranteed by characterization and is not tested in production.
(2) DAC Offset is the y-intercept of the straight line defined by DAC output at code 0d12 and 0d1011points of the measured transfer
characteristic.
(3) DAC Gain Error is the difference in slope of the straight line defined by DAC output at code 0d12 and 0d1011 points of transfer
characteristic, and that of the ideal characteristic.
6
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