FDC2212_16 Datasheet, PDF (6/61 Pages) Texas Instruments – EMI-Resistant 28-Bit,12-Bit Capacitance-to-Digital Converter

FDC2212, FDC2214, FDC2112, FDC2114
SNOSCZ5A – JUNE 2015 – REVISED JUNE 2015
8.5 Electrical Characteristics
Unless otherwise specified, all limits ensured for T_A = 25°C, VDD = 3.3 V⁽¹⁾
PARAMETER
TEST CONDITIONS⁽²⁾
POWER
V_DD
Supply voltage
I_DD
Supply durrent (not including
sensor current)⁽⁵⁾
I_DDSL
I_SD
Sleep mode supply current⁽⁵⁾
Shutdown mode supply current⁽⁵⁾
CAPACITIVE SENSOR
T_A = –40°C to +125°C
CLKIN = 10MHz⁽⁶⁾
C_SENSORMAX
C_IN
N_BITS
Maximum sensor capacitance
Sensor pin parasitic capacitance
Number of bits
1mH inductor, 10kHz oscillation
FDC2112, FDC2114
RCOUNT ≥ 0x0400
FDC2212, FDC2214
RCOUNT = 0xFFFF
f_CS
Maximum channel sample rate FDC2112, FDC2114
single active channel continuous
conversion, SCL = 400 kHz
FDC2212, FDC2214
single active channel continuous
conversion, SCL= 400 kHz
EXCITATION
f_SENSOR
V_SENSORMIN
Sensor excitation frequency
Minimum sensor oscillation
amplitude (pk)⁽⁷⁾
T_A = –40°C to +125°C
V_SENSORMAX
Maximum sensor oscillation
amplitude (pk)
I_SENSORMAX
Sensor maximum current drive
HIGH_CURRENT_DRV = b0
DRIVE_CURRENT_CH0 =
0xF800
HIGH_CURRENT_DRV = b1
DRIVE_CURRENT_CH0 =
0xF800
Channel 0 only
MASTER CLOCK
f_CLKIN
External master clock input
frequency (CLKIN)
T_A = –40°C to +125°C
CLKIN_{DUTY_MIN}
External master clock minimum
acceptable duty cycle (CLKIN)
CLKIN_{DUTY_MAX} External master clock maximum
acceptable duty cycle (CLKIN)
V_{CLKIN_LO}
CLKIN low voltage threshold
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MIN ⁽³⁾
TYP ⁽⁴⁾
MAX⁽³⁾ UNIT
2.7
3.6
V
2.1
mA
35
60 µA
0.2
1 µA
250
nF
4
pF
12 bits
28 bits
13.3 kSPS
4.08 kSPS
0.01
1.2
1.8
1.5
10 MHz
V
V
mA
6
mA
2
40 MHz
40%
60%
0.3*VDD
V
(1) Electrical Characteristics values apply only for factory testing conditions at the temperature indicated. Factory testing conditions result in
very limited self-heating of the device such that T_J = T_A. No guarantee of parametric performance is indicated in the electrical tables
under conditions of internal self-heating where T_J > T_A. Absolute Maximum Ratings indicate junction temperature limits beyond which
the device may be permanently degraded, either mechanically or electrically.
(2) Register values are represented as either binary (b is the prefix to the digits), or hexadecimal (0x is the prefix to the digits). Decimal
values have no prefix.
(3) Limits are ensured by testing, design, or statistical analysis at 25°C. Limits over the operating temperature range are ensured through
correlations using statistical quality control (SQC) method.
(4) Typical values represent the most likely parametric norm as determined at the time of characterization. Actual typical values may vary
over time and will also depend on the application and configuration. The typical values are not tested and are not ensured on shipped
production material.
(5) I2C read/write communication and pull-up resistors current through SCL, SDA not included.
(6) Sensor capacitor: 1 layer, 20.9 x 13.9 mm, Bourns CMH322522-180KL sensor inductor with L=18µH and 33pF 1% COG/NP0 Target:
Grounded aluminum plate (176 x 123 mm), Channel = Channel 0 (continuous mode) CLKIN = 40 MHz, CHx_FIN_SEL = b10,
CHx_FREF_DIVIDER = b00 0000 0001 CH0_RCOUNT = 0xFFFF, SETTLECOUNT_CH0 = 0x0100, DRIVE_CURRENT_CH0 = 0x7800.
(7) Lower V_SENSORMIN oscillation amplitudes can be used, but will result in lower SNR.
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