CD74FCT652 Datasheet, PDF (6/12 Pages) Texas Instruments – BiCMOS OCTAL BUS TRANSCEIVER AND REGISTER WITH 3-STATE OUTPUTS

CD74FCT652
BiCMOS OCTAL BUS TRANSCEIVER AND REGISTER
WITH 3-STATE OUTPUTS
SCBS734A – JULY 2000 – REVISED JULY 2000
absolute maximum ratings over operating free-air temperature range (unless otherwise noted)^†
DC supply voltage range, V_CC . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . –0.5 V to 6 V
DC input clamp current, I_IK (V_I < –0.5 V) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . –20 mA
DC output clamp current, I_OK (V_O < –0.5 V) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . –50 mA
DC output sink current per output pin, I_OL . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 70 mA
DC output source current per output pin, I_OH . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . –30 mA
Continuous current through V_CC, I_CC . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 140 mA
Continuous current through GND . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 528 mA
Package thermal impedance, θ_JA (see Note 1): EN package . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 67°C/W
M package . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 46°C/W
Storage temperature range, T_stg . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . –65°C to 150°C
† _{Stresses beyond those listed under “absolute maximum ratings” may cause permanent damage to the device. These are stress ratings only, and}
functional operation of the device at these or any other conditions beyond those indicated under “recommended operating conditions” is not
implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
NOTE 1: The package thermal impedance is calculated in accordance with JESD 51.
recommended operating conditions (see Note 2)
MIN MAX UNIT
VCC
VIH
VIL
VI
VO
IOH
IOL
∆t/∆v
Supply voltage
High-level input voltage
Low-level input voltage
Input voltage
Output voltage
High-level output current
Low-level output current
Input transition rise or fall rate
4.75 5.25 V
2
V
0.8 V
0 VCC V
0 VCC V
–15 mA
64 mA
0
10 ns/V
TA
Operating free-air temperature
0
70 °C
NOTE 2: All unused inputs of the device must be held at VCC or GND to ensure proper device operation. Refer to the TI application report,
Implications of Slow or Floating CMOS Inputs, literature number SCBA004.
electrical characteristics over recommended operating temperature range (unless otherwise
noted)
PARAMETER
TEST CONDITIONS
VCC
TA = 25°C
MIN
MIN MAX
VIK
II = –18 mA
4.75 V
–1.2
VOH
IOH = –15 mA
4.75 V
2.4
2.4
VOL
IOL = 64 mA
4.75 V
0.55
II
VI = VCC or GND
5.25 V
±0.1
IOZ
IOS‡
VO = VCC or GND
VI = VCC or GND,
VO = 0
5.25 V
5.25 V
±0.5
–60
–60
ICC
VI = VCC or GND,
IO = 0
5.25 V
8
∆ICC§
One input at 3.4 V,
Other inputs at VCC or GND
5.25 V
1.6
Ci
VI = VCC or GND
10
Co
VO = VCC or GND
15
‡ _{Not more than one output should be tested at a time, and the duration of the test should not exceed 100 ms.}
§ _{This is the increase in supply current for each input at one of the specified TTL voltage levels rather than 0 V or VCC.}
MAX
–1.2
0.55
±1
±10
80
1.6
10
15
UNIT
V
V
V
mA
mA
mA
mA
mA
pF
pF
6
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