TPS65735_16 Datasheet, PDF (5/39 Pages) Texas Instruments – PMU for Active Shutter 3D Glasses

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TPS65735
SLVSAI6A – JUNE 2011 – REVISED JANUARY 2016
4 Specifications
4.1 Absolute Maximum Ratings
over operating free-air temperature range (unless otherwise noted)⁽¹⁾⁽²⁾
MIN
MAX
UNIT
Input voltage on all pins (except for VIN, BST_OUT, BST_SW, BST_FB, VLDO, LCLP,
LCLN, LCRP, LCRN, AGND, DGND, and PGNDBST) with respect to AGND
–0.3
7
V
VIN with respect to AGND
–0.3
28
V
BST_OUT, BST_SW, LCLP, LCLN, LCRP, and LCRN with respect to PGNDBST
–0.3
18
V
BST_FB with respect to PGNDBST, VLDO with respect to DGND
–0.3
3.6
V
T_A
Operating free-air temperature
T_J
Junction temperature
Electrical characteristics ensured
Functionality ensured⁽³⁾
0
60
°C
0
85
°C
0
105
T_stg
Storage temperature
–55
150
°C
(1) Stresses beyond those listed under Absolute Maximum Ratings may cause permanent damage to the device. These are stress ratings
only, which do not imply functional operation of the device at these or any other conditions beyond those indicated under Recommended
Operating Conditions. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
(2) All voltage values are with respect to V_SS, unless otherwise noted.
(3) Device has a thermal shutdown feature implemented that shuts down at 105°C
4.2 ESD Ratings
V_ESD
Electrostatic discharge
Human Body Model (HBM), per ANSI/ESDA/JEDEC JS001⁽¹⁾
Charged Device Model (CDM),
per JESD22-C101⁽²⁾
VALUE
±1000
±250
(1) JEDEC document JEP155 states that 500-V HBM allows safe manufacturing with a standard ESD control process.
(2) JEDEC document JEP157 states that 250-V CDM allows safe manufacturing with a standard ESD control process.
UNIT
V
4.3 Power-On Hours (POH)
See ^{(1) (2) (3) (4)}
OPERATING
CONDITION
NOMINAL CVDD VOLTAGE (V)
JUNCTION TEMPERATURE (T_j)
LIFETIME POH⁽⁵⁾
100% OPP
1.1
–40 to 105 °C
100 K
120% OPP
1.2
–40 to 105 °C
100 K
166% OPP
1.35
–40 to 105 °C
49 K
(1) This information is provided solely for your convenience and does not extend or modify the warranty provided under TI's standard terms
and conditions for TI semiconductor products.
(2) To avoid significant degradation, the device power-on hours (POH) must be limited to those specified in this table.
(3) Logic functions and parameter values are not assured out of the range specified in the recommended operating conditions.
(4) Notations in this table cannot be deemed a warranty or deemed to extend or modify the warranty under TI's standard terms and
conditions for TI semiconductor products.
(5) POH represent device operation under the specified nominal conditions continuously for the duration of the calculated lifetime.
Copyright © 2011–2016, Texas Instruments Incorporated
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