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ADC10731_14 Datasheet, PDF (5/34 Pages) Texas Instruments – 10-Bit Plus Sign Serial I/O A/D Converters with Mux, Sample/Hold and Reference
ADC10731, ADC10732, ADC10734, ADC10738
www.ti.com
SNAS081D – MAY 1999 – REVISED MARCH 2013
Electrical Characteristics
The following specifications apply for V+ = AV+ = DV+ = +5.0 VDC, VREF+ = 2.5 VDC, VREF− = GND, VIN− = 2.5V for Signed
Characteristics, VIN− = GND for Unsigned Characteristics and fCLK = 2.5 MHz unless otherwise specified. Boldface limits
apply for TA = TJ = TMIN to TMAX; all other limits TA = TJ = +25°C.(1)(2)(3)(4)
Parameter
Test Conditions
Typ (5)
Limits (6)
Units
(Limits)
SIGNED STATIC CONVERTER CHARACTERISTICS
TUE
Resolution with No Missing Codes
Total Unadjusted Error(7)
10 + Sign
Bits
±2.0
LSB (max)
INL
Positive and Negative Integral Linearity Error
±1.25
LSB (max)
Positive and Negative Full-Scale Error
±1.5
LSB (max)
Offset Error
±1.5
LSB (max)
Power Supply Sensitivity
Offset Error
+ Full-Scale Error
±0.2
±1.0
LSB (max)
V+ = +5.0V ±10%
±0.2
±1.0
LSB (max)
− Full-Scale Error
±0.1
±0.75
LSB (max)
DC Common Mode Error(8)
Multiplexer Chan to Chan Matching
VIN+ = VIN− = VIN where
5.0V ≥ VIN ≥ 0V
±0.1
±0.1
±0.33
LSB (max)
LSB
UNSIGNED STATIC CONVERTER CHARACTERISTICS
TUE
INL
Resolution with No Missing Codes
Total Unadjusted Error(7)
Integral Linearity Error
Full-Scale Error
Offset Error
Power Supply Sensitivity
Offset Error
Full-Scale Error
DC Common Mode Error(8)
Multiplexer Channel to Channel Matching
DYNAMIC SIGNED CONVERTER CHARACTERISTICS
VREF+ = 4.096V
VREF+ = 4.096V
VREF+ = 4.096V
VREF+ = 4.096V
V+ = +5.0V ±10%
VREF+ = 4.096V
VIN+ = VIN− = VIN where
+5.0V ≥ VIN ≥ 0V
VREF+ = 4.096V
±0.75
±0.50
±0.1
±0.1
±0.1
±0.1
10
±1.25
±1.25
Bits
LSB
LSB
LSB (max)
LSB (max)
LSB
LSB
LSB
LSB
S/(N+D) Signal-to-Noise Plus Distortion Ratio
VIN = 4.85 VPP, and
fIN = 1 kHz to 15 kHz
67
dB
ENOB Effective Number of Bits
VIN = 4.85 VPP, and
fIN = 1 kHz to 15 kHz
10.8
Bits
THD
Total Harmonic Distortion
VIN = 4.85 VPP, and
fIN = 1 kHz to 15 kHz
−78
dB
IMD
Intermodulation Distortion
VIN = 4.85 VPP, and
fIN = 1 kHz to 15 kHz
−85
dB
Full-Power Bandwidth
VIN = 4.85 VPP, where
S/(N + D) Decreases 3 dB
380
kHz
Multiplexer Chan to Chan Crosstalk
fIN = 15 kHz
−80
dB
(1) Two on-chip diodes are tied to each analog input as shown below. They will forward-conduct for analog input voltages one diode drop
below ground or one diode drop greater than V+ supply. Be careful during testing at low V+ levels (+4.5V), as high level analog inputs
(+5V) can cause an input diode to conduct, especially at elevated temperatures, which will cause errors In the conversion result. The
specification allows 50 mV forward bias of either diode; this means that as long as the analog VIN does not exceed the supply voltage by
more than 50 mV, the output code will be correct. Exceeding this range on an unselected channel will corrupt the reading of a selected
channel. If AV+ and DV+ are minimum (4.5 VDC) and full scale must be ≤+4.55 VDC. See Figure 6
(2) No connection exists between AV+ and DV+ on the chip.To ensure accuracy, it is required that the AV+ and DV+ be connected together
to a power supply with separate bypass filter at each V+ pin.
(3) One LSB is referenced to 10 bits of resolution.
(4) All the timing specifications are tested at the TTL logic levels, VIL = 0.8V for a falling edge and VIH = 2.0V for a rising. TRl-STATE
voltage level is forced to 1.4V.
(5) Typicals are at TJ = TA = 25°C and represent most likely parametric norm.
(6) Tested limits are ensured to AOQL (Average Outgoing Quality Level).
(7) Total unadjusted error includes offset, full-scale, linearity, multiplexer, and hold step errors.
(8) The DC common-mode error is measured in the differential multiplexer mode with the assigned positive and negative input channels
shorted together.
Copyright © 1999–2013, Texas Instruments Incorporated
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