TL750M05-Q1 Datasheet, PDF (4/23 Pages) Texas Instruments – AUTOMOTIVE LOW-DROPOUT VOLTAGE REGULATORS

TL750Mxx-Q1, TL751Mxx-Q1
SGLS312J – SEPTEMBER 2005 – REVISED JUNE 2011
TL751Mxx ELECTRICAL CHARACTERISTICS
V_I = 14 V, I_O = 300 mA, T_J = 25°C
PARAMETER
Response time, ENABLE to output (start-up)
www.ti.com
TL751Mxx
TYP
50
UNIT
µs
TL750M05/TL751M05 ELECTRICAL CHARACTERISTICS
V_I = 14 V, I_O = 300 mA, ENABLE at 0 V for TL751M05, T_J = –40°C to 125°C (unless otherwise noted)⁽¹⁾
PARAMETER
TEST CONDITIONS
TL750M05
TL751M05
MIN TYP MAX
UNIT
Output voltage
Line regulation
Power-supply ripple rejection
Load regulation
Dropout voltage⁽²⁾
Current consumption
I_q = I_I – I_O
Shutdown current (TL751M05 only)
V_I = 6 V to 26 V
V_I = 9 V to 16 V,
I_O = 250 mA
V_I = 6 V to 26 V,
I_O = 250 mA
V_I = 8 V to 18 V,
f = 120 Hz
I_O = 5 mA to 750 mA
I_O = 500 mA, T_J = 25°C
I_O = 750 mA, T_J = 25°C
I_O = 750 mA
I_O = 10 mA
ENABLE V_IH ≥ 2 V
4.85
5 5.15 V
10
25
mV
12
50
55
dB
20
50 mV
0.5
V
0.65
60
75
mA
5
200 µA
(1) Pulse-testing techniques maintain the junction temperature as close to the ambient temperature as possible. Thermal effects must be
taken into account separately. All characteristics are measured with a 0.1-µF capacitor across the input and a 10-µF tantalum capacitor
on the output, with equivalent series resistance within the guidelines shown in Figure 4.
(2) Measured when the output voltage, V_O, has dropped 100 mV from the nominal value obtained at V_I = 14 V.
TL750M08/TL751M08 ELECTRICAL CHARACTERISTICS
V_I = 14 V, I_O = 300 mA, ENABLE at 0 V for TL751M08, T_J = –40°C to 125°C (unless otherwise noted)⁽¹⁾
PARAMETER
TEST CONDITIONS
TL750M08
TL751M08
MIN TYP MAX
UNIT
Output voltage
Line regulation
Power-supply ripple rejection
Load regulation
Dropout voltage⁽²⁾
Current consumption
I_q = I_I – I_O
Shutdown current (TL751M08 only)
V_I = 6 V to 26 V
V_I = 10 V to 17 V, I_O = 250 mA
V_I = 9 V to 26 V,
I_O = 250 mA
V_I = 11 V to 21 V, f = 120 Hz
I_O = 5 mA to 750 mA
I_O = 500 mA, T_J = 25°C
I_O = 750 mA, T_J = 25°C
I_O = 750 mA, T_J = 25°C
I_O = 10 mA
ENABLE V_IH ≥ 2 V
7.76
8 8.24 V
12
40
mV
15
68
55
dB
24
80 mV
0.5
V
0.65
60
75
mA
5
200 µA
(1) Pulse-testing techniques maintain the junction temperature as close to the ambient temperature as possible. Thermal effects must be
taken into account separately. All characteristics are measured with a 0.1-µF capacitor across the input and a 10-µF tantalum capacitor
on the output, with equivalent series resistance within the guidelines shown in Figure 4.
(2) Measured when the output voltage, V_O, has dropped 100 mV from the nominal value obtained at V_I = 14 V.
4
Copyright © 2005–2011, Texas Instruments Incorporated