TCAN1051H Datasheet, PDF (4/35 Pages) Texas Instruments – Fault Protected CAN Transceiver with CAN FD

TCAN1051H, TCAN1051HV
TCAN1051HG, TCAN1051HGV
SLLSES8B – MARCH 2016 – REVISED MAY 2016
www.ti.com
7 Specifications
7.1 Absolute Maximum Ratings^{(1) (2)}
V_CC
V_IO
V_BUS
V_{(Logic_Input)}
V_{(Logic_Output)}
I_O(RXD)
T_J
5-V Bus Supply Voltage Range
All Devices
I/O Level-Shifting Voltage Range
Devices with the "V" Suffix
CAN Bus I/O voltage range (CANH,
CANL)
Devices with the "H" Suffix
Logic input terminal voltage range
(TXD, S)
Logic output terminal voltage range All Devices
(RXD)
RXD (Receiver) output current
Operating virtual junction temperature range (see Thermal
Information)
MIN
–0.3
–0.3
-70
–0.3
–0.3
–8
–55
MAX
7
7
70
+7 and V_I ≤ V_IO + 0.3
+7 and V_I ≤ V_IO + 0.3
8
150
UNIT
V
V
V
V
V
mA
°C
(1) Stresses beyond those listed under "absolute maximum ratings" may cause permanent damage to the device. These are stress ratings
only and functional operation of the device at these or any other conditions beyond those indicated under "recommended operating
conditions" is not implied. Exposure to absolute-maximum-rated condition for extended periods may affect device reliability.
(2) All voltage values, except differential I/O bus voltages, are with respect to ground terminal.
7.2 ESD Ratings
Human Body Model (HBM) ESD stress voltage
Charged Device Model (CDM) ESD stress voltage
Machine Model
System Level Electro-Static Discharge (ESD)
System Level Electrical fast transient (EFT)
TEST CONDITIONS
All terminals⁽¹⁾
CAN bus terminals (CANH, CANL) to GND⁽²⁾
All terminals⁽³⁾
All terminals⁽⁴⁾
CAN bus terminals
(CANH, CANL) to
GND
IEC 61000-4-2: Unpowered
Contact Discharge
IEC 61000-4-2: Powered
Contact Discharge
CAN bus terminals
(CANH, CANL) to
GND
IEC 61000-4-2: Powered on
Contact Discharge, Criteria A
(1) Tested in accordance to JEDEC Standard 22, Test Method A114.
(2) Test method based upon JEDEC Standard 22 Test Method A114, CAN bus is stressed with respect to GND.
(3) Tested in accordance to JEDEC Standard 22, Test Method C101.
(4) Tested in accordance to JEDEC Standard 22, Test Method A115.
VALUE
±6000
±10000
±750
±200
±15000
±8000
±4000
UNIT
V
V
V
V
V
4
Submit Documentation Feedback
Copyright © 2016, Texas Instruments Incorporated
Product Folder Links: TCAN1051H TCAN1051HV TCAN1051HG TCAN1051HGV