HD3SS6126_14 Datasheet, PDF (4/17 Pages) Texas Instruments – USB 3.0 and USB 2.0 Differential Switch 2:1/1:2 MUX/DEMUX

HD3SS6126
SLAS975 – NOVEMBER 2013
NAME
GND
HSA(p)
HSA(n)
HSB(p)
HSB(n)
HSC(p)
HSC(n)
PIN
NO.
10, 14, 17,
19, 21
8
7
31
32
33
34
HS_OE
6
NC
SEL
SSA0(p)
SSA0(n)
SSA1(p)
SSA1(n)
SSB0(p)
SSB0(n)
SSB1(p)
SSB1(n)
SSC0(p)
SSC0(n)
SSC1(p)
SSC1(n)
VDD
1, 2, 3, 4, 5,
18, 35, 36,
37, 38, 39,
40, 41, 42
9
11
12
15
16
29
28
27
26
25
24
23
22
13, 20, 30
I/O
Supply
Ground
PIN FUNCTIONS
DESCRIPTION
I/O
I/O
I/O
I (Control)
Port A USB 2.0 positive signal
Port A USB 2.0 negative signal
Port B USB 2.0 positive signal
Port B USB 2.0 negative signal
Port C USB 2.0 positive signal
Port C USB 2.0 negative signal
Output Enable
H = Power Down
L = Normal Operation
Electrically No Connection
I (Control)
I/O
I/O
I/O
I/O
I/O
I/O
Supply
USB 3.0/2.0 Port Selection Control Pins
Port A, Channel 0, USB 3.0 Positive Signal
Port A, Channel 0, USB 3.0 Negative Signal
Port A, Channel 1, USB 3.0 Positive Signal
Port A, Channel 1, USB 3.0 Negative Signal
Port B, Channel 0, USB 3.0 Positive Signal
Port B, Channel 0, USB 3.0 Negative Signal
Port B, Channel 1, USB 3.0 Positive Signal
Port B, Channel 1, USB 3.0 Negative Signal
Port C, Channel 0, USB 3.0 Positive Signal
Port C, Channel 0, USB 3.0 Negative Signal
Port C, Channel 1, USB 3.0 Positive Signal
Port C, Channel 1, USB 3.0 Negative Signal
3.3V power supply voltage
www.ti.com
ABSOLUTE MAXIMUM RATINGS
over operating free-air temperature range (unless otherwise noted) ⁽¹⁾
Supply voltage range⁽²⁾, V_DD
Differential I/O, High-bandwidth signal path: SSA0/1(p/n), SSB0/1(p/n),
SSC0/1(p/n)
Voltage range
Differential I/O, Low-bandwidth signal path: HSAp/n), HSB(p/n),
HSC(p/n)
Electrostatic discharge
Control pin and single ended I/O
Human body model⁽³⁾⁽⁴⁾
Charged-device model⁽⁵⁾
Continuous power dissipation
MIN
MAX UNIT
–0.3
4
V
–0.5
4
-0.5
7
V
–0.3 V_DD + 0.3
±2,000
V
±500
See Thermal Information Table
(1) Stresses beyond those listed under absolute maximum ratings may cause permanent damage to the device. These are stress ratings
only and functional operation of the device at these or any conditions beyond those indicated under recommended operating conditions
is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
(2) All voltage values, except differential voltages, are with respect to network ground terminal.
(3) Tested in accordance with JEDEC Standard 22, Test Method A114-B
(4) Tested in accordance with JEDEC Standard 22, Test Method C101-A
(5) Tested in accordance with JEDEC Standard 22, Test Method A115-A
4
Submit Documentation Feedback
Product Folder Links :HD3SS6126
Copyright © 2013, Texas Instruments Incorporated