DS96F172MQML_13 Datasheet, PDF (4/14 Pages) Texas Instruments – EIA-485/EIA-422 Quad Differential Drivers

DS96F172MQML, DS96F174MQML
SNOSAS8A – APRIL 2011 – REVISED APRIL 2013
Quality Conformance Inspection
Subgroup
1
2
3
4
5
6
7
8A
8B
9
10
11
12
13
14
Table 3. Mil-Std-883, Method 5005 - Group A
Description
Static tests at
Static tests at
Static tests at
Dynamic tests at
Dynamic tests at
Dynamic tests at
Functional tests at
Functional tests at
Functional tests at
Switching tests at
Switching tests at
Switching tests at
Settling time at
Settling time at
Settling time at
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Temp (°C)
+25
+125
-55
+25
+125
-55
+25
+125
-55
+25
+125
-55
+25
+125
-55
DS96F172/DS96F174 Electrical Characteristics AC/DC Parameters⁽¹⁾
The following conditions apply, unless otherwise specified.
DC: V_CC = 5.5V
AC: V_CC = 5.0V
Parameter
Test Conditions
Notes Min
V_IL
V_IH
V_IC
V_OD1
V_OD2
V_OD2
Logical 0 Input Voltage
Logical 1 Input Voltage
Input Clamp Voltage
Differential Output Voltage
Differential Output Voltage
Differential Output Voltage
ΔV_OD1 Change In Magnitude of V_OD2
ΔV_OD2 Change In Magnitude of V_OD2
V_OC
Common Mode Output Voltage
V_OC
Common Mode Output Voltage
ΔV_OC Change in Magnitude of V_OC
ΔV_OC Change in Magnitude of V_OC
I_O
Output Current With Power Off
I = -18mA
I_O = 0mA
V_CC = 4.5V, R_L = 54Ω
Figure 7
V_CC = 4.5V, R_L = 100Ω
Figure 7
V_CC = 4.5V, R_L = 54Ω
V_CC = 4.5V, R_L = 100Ω
R_L = 54Ω
Figure 7
R_L = 100Ω
Figure 7
V_CC = 4.5V, R_L = 54Ω
Figure 7
V_CC = 4.5V, R_L = 100Ω
Figure 7
V_CC = 0V, V_O = -7V to 12V
2.0
-1.5
See ⁽²⁾
See ⁽³⁾
See ^{(2) (3)}
See ⁽³⁾
See ^{(2) (3)}
1.5
1.2
2.0
-200
-400
-200
-400
See ⁽³⁾
See ⁽⁴⁾
-200
-200
-50
Max Units
0.8
V
0.7
V
V
V
6.0
V
V
V
V
200
mV
400
mV
200
mV
400
mV
3.0
V
3.0
V
200
mV
200
mV
50
µA
Sub-
groups
1
2, 3
1, 2, 3
1, 2, 3
1, 2, 3
1, 2
3
1, 2, 3
1, 2
3
1, 2
3
1, 2, 3
1, 2, 3
1, 2, 3
1, 2, 3
1, 2, 3
(1) All currents into the device pins are positive; all currents out of the device pins are negative. All voltages are reference to ground unless
otherwise specified.
(2) −55°C limit exceeds EIA standard RS−485 specification
(3) Δ|V_OD| is the change in magnitude of V_OD, that occurs when the input is changed between high and low levels.
(4) Δ|V_OC| is the change in magnitude of the V_OC that occurs when the input is changed between high and low levels.
4
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