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BQ294602_17 Datasheet, PDF (4/21 Pages) Texas Instruments – Single-Cell Protector for Li-Ion Batteries | |||
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bq294602, bq294604, bq294682, bq294624
SLUSAS0D â DECEMBER 2011 â REVISED APRIL 2017
www.ti.com
7 Specifications
7.1 Absolute Maximum Ratings
over operating free-air temperature range (unless otherwise noted)(1)
Supply voltage
Input voltage
Output voltage
Continuous total power dissipation, PTOT
Functional temperature
Lead temperature (soldering, 10 s), TSOLDER
Storage temperature, Tstg
VDDâVSS
V1âVSS
OUTâVSS
MIN
MAX
â0.3
30
â0.3
8
â0.3
30
See Thermal
Information
â65
110
300
â65
150
UNIT
V
V
V
°C
°C
°C
(1) Stresses beyond those listed under Absolute Maximum Ratings may cause permanent damage to the device. These are stress ratings
only, which do not imply functional operation of the device at these or any other conditions beyond those indicated under Recommended
Operating Conditions. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
7.2 ESD Ratings
V(ESD)
Electrostatic discharge
Human body model (HBM), per ANSI/ESDA/JEDEC JS-001(1)
Charged device model (CDM), per JEDEC specification JESD22-C101(2)
VALUE
±2000
±500
(1) JEDEC document JEP155 states that 500-V HBM allows safe manufacturing with a standard ESD control process.
(2) JEDEC document JEP157 states that 250-V CDM allows safe manufacturing with a standard ESD control process.
UNIT
V
7.3 Recommended Operating Conditions
over operating free-air temperature range (unless otherwise noted)
Supply voltage, VDD(1)
Input voltage
V1âVSS
Operating ambient temperature, TA
(1) See Typical Application.
MIN
MAX
UNIT
3
8
V
0
5
V
â40
110
°C
7.4 Thermal Information
THERMAL METRIC(1)
bq2946xx
DRV (SON)
UNIT
6 PINS
RθJA
RθJC(top)
RθJB
ÏJT
ÏJB
RθJC(bot)
Junction-to-ambient thermal resistance
Junction-to-case(top) thermal resistance
Junction-to-board thermal resistance
Junction-to-top characterization parameter
Junction-to-board characterization parameter
Junction-to-case(bottom) thermal resistance
186.4
90.4
110.7
96.7
90
n/a
°C/W
°C/W
°C/W
°C/W
°C/W
°C/W
(1) For more information about traditional and new thermal metrics, see the Semiconductor and IC Package Thermal Metrics application
report.
4
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