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ADS774H Datasheet, PDF (4/23 Pages) Texas Instruments – Microprocessor-Compatible Sampling CMOS ANALOG-TO-DIGITAL CONVERTER
ADS774H
SBAS443 – AUGUST 2009 ................................................................................................................................................................................................ www.ti.com
ELECTRICAL CHARACTERISTICS (continued)
All specifications at TA = TMIN to TMAX, VDD = +5V, VEE = –15V to +5V, sampling frequency of 117kHz, and fIN = 10kHz, unless otherwise
noted.
ADS774HI
ADS774HIB (1)
PARAMETER
CONDITIONS
MIN
TYP
MAX
MIN
TYP
MAX UNIT
SAMPLING DYNAMICS
Sampling rate
Aperture delay, tAP
Aperture uncertainty (jitter)
Settling time to 0.01% for
full-scale input change
At +25°C
TMIN to TMAX
with VEE = +5V
with VEE = 0V to –15V
with VEE = +5V
with VEE = 0V to –15V
125
117
20
1.6
300
10
1.4
125
117
20
1.6
300
10
1.4
kHz
kHz
ns
µs
ps RMS
ns RMS
µs
DIGITAL OUTPUTS (DB11 to DB0, STATUS)
Output codes
Unipolar
Bipolar
Unipolar straight binary (USB)
Bipolar offset binary (BOB)
Unipolar straight binary (USB)
Bipolar offset binary (BOB)
Logic levels
Leakage, data bits only, high-Z
state
Logic 0 (ISINK = 1.6mA)
Logic 1 (ISOURCE = 500µA)
+0.4
+0.4
V
+2.4
+2.4
V
–5
0.1
+5
–5
0.1
+5
µA
Capacitance
5
5
pF
INTERNAL REFERENCE VOLTAGE
Voltage
+2.4
+2.5
+2.6
+2.4
+2.5
+2.6
V
Source current available for
external loads
0.5
0.5
mA
POWER-SUPPLY REQUIREMENTS
Voltage
Current
VEE (8)
VDD
IEE (8)
IDD
VEE = –15V
Power dissipation, tMIN to tMAX
VEE = 0V to +5V
TEMPERATURE RANGE
–16.5
+4.5
VDD
+5.5
–16.5
+4.5
–1
+15
+24
75
120
VDD
V
+5.5
V
–1
mA
+15
+24 mA
75
120 mW
Specified
–40
+85
–40
+85
°C
Operating
–40
+85
–40
+85
°C
Storage
–65
+150
–65
+150
°C
(8) VEE is optional, and is only used to set the mode for the internal sample/hold. When VEE = –15V, IEE = –1mA typ; when VEE = 0V, IEE =
±5mA typ; when VEE = +5V, IEE = +167mA typ.
4
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