TMS320F28027_17 Datasheet, PDF (35/138 Pages) Texas Instruments – Piccolo Microcontrollers

www.ti.com
TMS320F28027, TMS320F28026, TMS320F28023, TMS320F28022
TMS320F28021, TMS320F28020, TMS320F280200
SPRS523K – NOVEMBER 2008 – REVISED JUNE 2016
Table 5-20. Flash Parameters at 40-MHz SYSCLKOUT
PARAMETER
TEST
CONDITIONS
MIN TYP MAX UNIT
I_DDP ⁽¹⁾
I_DDIOP ⁽¹⁾
I_DDIOP ⁽¹⁾
V_DD current consumption during Erase/Program cycle
V_DDIO current consumption during Erase/Program cycle
V_DDIO current consumption during Erase/Program cycle
VREG disabled
VREG enabled
60
mA
60
100
mA
(1) Typical parameters as seen at room temperature including function call overhead, with all peripherals off. It is important to maintain a
stable power supply during the entire flash programming process. It is conceivable that device current consumption during flash
programming could be higher than normal operating conditions. The power supply used should ensure V_MIN on the supply rails at all
times, as specified in the Recommended Operating Conditions of the data sheet. Any brown-out or interruption to power during
erasing/programming could potentially corrupt the password locations and lock the device permanently. Powering a target board (during
flash programming) through the USB port is not recommended, as the port may be unable to respond to the power demands placed
during the programming process.
Table 5-21. Flash Program/Erase Time
PARAMETER
TEST
CONDITIONS
MIN TYP MAX UNIT
Program Time 16-Bit Word
50
μs
8K Sector
250
ms
Erase Time⁽¹⁾
4K Sector
8K Sector
125
ms
2
s
4K Sector
2
s
(1) The on-chip flash memory is in an erased state when the device is shipped from TI. As such, erasing the flash memory is not required
prior to programming, when programming the device for the first time. However, the erase operation is needed on all subsequent
programming operations.
t_a(fp)
t_a(fr)
t_a(OTP)
Table 5-22. Flash/OTP Access Timing
PARAMETER
Paged Flash access time
Random Flash access time
OTP access time
MIN
MAX UNIT
40
ns
40
ns
60
ns
t_retention
Table 5-23. Flash Data Retention Duration
PARAMETER
Data retention duration
TEST CONDITIONS
T_J = 55°C
MIN MAX UNIT
15
years
Copyright © 2008–2016, Texas Instruments Incorporated
Specifications
35
Submit Documentation Feedback
Product Folder Links: TMS320F28027 TMS320F28026 TMS320F28023 TMS320F28022 TMS320F28021
TMS320F28020 TMS320F280200