MSP430F21X1_14 Datasheet, PDF (33/62 Pages) Texas Instruments – MIXED SIGNAL MICROCONTROLLER

MSP430F21x1
www.ti.com
SLAS439F – SEPTEMBER 2004 – REVISED AUGUST 2011
Flash Memory
over recommended ranges of supply voltage and operating free-air temperature (unless otherwise noted)
V_{CC (PGM/ERASE)}
f_FTG
I_PGM
I_ERASE
t_CPT
t_CMErase
PARAMETER
Program and erase supply voltage
Flash timing generator frequency
Supply current from V_CC during program
Supply current from V_CC during erase
Cumulative program time⁽¹⁾
Cumulative mass erase time
Program/erase endurance
TEST CONDITIONS
V_CC
2.2 V/3.6 V
2.2 V/3.6 V
2.2 V/3.6 V
2.2 V/3.6 V
MIN TYP MAX UNIT
2.2
3.6 V
257
476 kHz
3
5 mA
3
7 mA
10 ms
20
10⁴
10⁵
ms
cycles
t_Retention
t_Word
t_{Block, 0}
t_{Block, 1-63}
t_{Block, End}
t_{Mass Erase}
t_{Seg Erase}
Data retention duration
Word or byte program time
Block program time for first byte or word
Block program time for each additional
byte or word
Block program end-sequence wait time
Mass erase time
Segment erase time
T_J = 25°C
See ⁽²⁾
See ⁽²⁾
See ⁽²⁾
See ⁽²⁾
See ⁽²⁾
See ⁽²⁾
100
30
25
18
6
10593
4819
years
t_FTG
t_FTG
t_FTG
t_FTG
t_FTG
t_FTG
(1) The cumulative program time must not be exceeded when writing to a 64-byte flash block. This parameter applies to all programming
methods: individual word/byte write and block write modes.
(2) These values are hardwired into the flash controller's state machine (t_FTG = 1/f_FTG).
RAM
over recommended ranges of supply voltage and operating free-air temperature (unless otherwise noted)
V_(RAMh)
PARAMETER
RAM retention supply voltage ⁽¹⁾
TEST CONDITIONS
MIN
CPU halted
1.6
MAX UNIT
V
(1) This parameter defines the minimum supply voltage V_CC when the data in RAM remains unchanged. No program execution should
happen during this supply voltage condition.
JTAG Interface
over recommended ranges of supply voltage and operating free-air temperature (unless otherwise noted)
PARAMETER
f_TCK
TCK input frequency⁽¹⁾
V_CC
2.2 V
3V
MIN TYP
0
0
R_Internal
Internal pulldown resistance on TEST
2.2 V/3 V
25
60
(1) f_TCK may be restricted to meet the timing requirements of the module selected.
MAX
5
10
90
UNIT
MHz
MHz
kΩ
JTAG Fuse⁽¹⁾
over recommended ranges of supply voltage and operating free-air temperature (unless otherwise noted)
V_CC(FB)
V_FB
I_FB
t_FB
PARAMETER
Supply voltage during fuse-blow condition
Voltage level on TEST for fuse blow
Supply current into TEST during fuse blow
Time to blow fuse
T_A
25°C
25°C
25°C
25°C
MIN MAX UNIT
2.5
V
6
7V
100 mA
1 ms
(1) Once the fuse is blown, no further access to the JTAG/Test and emulation features is possible, and the JTAG block is switched to
bypass mode.
Copyright © 2004–2011, Texas Instruments Incorporated
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