SN74LVC1G00_16 Datasheet, PDF (3/36 Pages) Texas Instruments – SN74LVC1G00_16

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6 Pin Configuration and Functions
SN74LVC1G00
SCES212AB – APRIL 1999 – REVISED APRIL 2014
A
B
GND
DBV PACKAGE
(TOP VIEW)
1
5
2
3
4
DCK PACKAGE
(TOP VIEW)
V_CC
A
1
5
V_CC
B
2
GND
3
4Y
Y
NC – No internal connection
See mechanical drawings for dimensions.
DRL PACKAGE
(TOP VIEW)
DRY PACKAGE
(TOP VIEW)
A1
B2
GND 3
5 V_CC
A1
B2
4Y
GND ³
6 V_CC
5 NC
4Y
YZP PACKAGE
(BOTTOM VIEW)
GND ^{3 4} Y
B²
A ^{1 5} V_CC
DSF PACKAGE
(TOP VIEW)
A1
B2
GND 3
6 V_CC
5 NC
4Y
DPW PACKAGE
(TOP VIEW)
GND ^{B 1} 3 ^{V 5 CC}
A^{2 4}Y
NAME
A
B
GND
Y
V_CC
NC
PIN
DBV, DCK,
DRL, YZP
DRY, DSF
1
1
2
2
3
3
4
4
5
6
5
DPW
2
1
3
4
5
Pin Functions
DESCRIPTION
Input
Input
Ground
Output
Power pin
Not connected
7 Specifications
7.1 Absolute Maximum Ratings⁽¹⁾
over operating free-air temperature range (unless otherwise noted)
MIN
MAX UNIT
V_CC
Supply voltage range
V_I
Input voltage range
V_O
Voltage range applied to any output in the high-impedance or power-off state⁽²⁾
V_O
Voltage range applied to any output in the high or low state⁽²⁾⁽³⁾
I_IK
Input clamp current
V_I < 0
I_OK
Output clamp current
V_O < 0
I_O
Continuous output current
Continuous current through V_CC or GND
–0.5
6.5 V
–0.5
6.5 V
–0.5
6.5 V
–0.5 V_CC + 0.5
V
–50 mA
–50 mA
±50 mA
±100 mA
(1) Stresses beyond those listed under Absolute Maximum Ratings may cause permanent damage to the device. These are stress ratings
only, and functional operation of the device at these or any other conditions beyond those indicated under Recommended Operating
Conditions is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
(2) The input and output negative-voltage ratings may be exceeded if the input and output current ratings are observed.
(3) The value of V_CC is provided in the Recommended Operating Conditions table.
7.2 Handling Ratings
T_stg
V_(ESD)
Storage temperature range
Electrostatic discharge
Human body model (HBM), per ANSI/ESDA/JEDEC JS-001, all
pins ⁽¹⁾
Charged device model (CDM), per JEDEC specification
JESD22-C101, all pins⁽²⁾
MIN
–65
0
MAX
150
2000
0
1000
(1) JEDEC document JEP155 states that 500-V HBM allows safe manufacturing with a standard ESD control process.
(2) JEDEC document JEP157 states that 250-V CDM allows safe manufacturing with a standard ESD control process.
UNIT
°C
V
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