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LP2981-N Datasheet, PDF (3/24 Pages) Texas Instruments – Micropower 100 mA Ultra Low-Dropout Regulator in SOT-23 Package
LP2981-N
www.ti.com
SNOS773K – MARCH 2000 – REVISED APRIL 2013
ELECTRICAL CHARACTERISTICS
Limits in standard typeface are for TJ = 25°C, and limits in boldface type applyover the full operating temperature range.
Unless otherwise specified: VIN = VO(NOM) + 1V, CIN = 1 μF, IL = 1 mA, COUT = 4.7 μF,VON/OFF = 2V.
Symbol
Parameter
Conditions
Typ
LP2981AI-XX (1)
LP2981I-XX (1)
Units
Min
Max
Min
Max
ΔVO
Output Voltage Tolerance IL = 1mA
1 mA < IL < 100 mA
−0.75
−1.0
−2.5
0.75
1.0
2.5
−1.25
−2.0
−3.5
1.25
2.0
3.5
%VNOM
VIN–VO
Output Voltage
Line Regulation
Dropout Voltage(2)
VO(NOM) + 1V
≤ VIN ≤ 16V
IL = 0
0.007
1
0.014
0.032
3
5
0.014
%/V
0.032
3
mV
5
IL = 1 mA
7
10
10
15
15
IL = 25 mA
70
100
100
150
150
IL = 100 mA
200
250
250
375
375
IGND
Ground Pin Current
IL = 0
65
95
95
μA
125
125
IL = 1 mA
80
110
110
170
170
IL = 25 mA
200
300
300
550
550
IL = 100 mA
600
800
800
1500
1500
VON/OFF
ON/OFF Input Voltage(3)
VON/OFF < 0.3V
VON/OFF < 0.15V
High = O/P ON
Low = O/P OFF
0.01
0.8
0.8
0.05
2
2
1.4
1.6
1.6
V
0.50
0.15
0.15
ION/OFF
IO(PK)
en
ON/OFF Input Current
Peak Output Current
Output Noise
Voltage (RMS)
Ripple Rejection
VON/OFF = 0
VON/OFF = 5V
VOUT ≥ VO(NOM) − 5%
BW = 300 Hz–50 kHz,
COUT = 10 μF
f = 1 kHz
0.01
−1
−1
μA
5
15
15
400
150
150
mA
160
μV
63
dB
COUT = 10 μF
IO(MAX)
Short Circuit Current
RL = 0 (Steady State)(4)
150
mA
(1) Limits are 100% production tested at 25°C. Limits over the operating temperature range are specified through correlation using
Statistical Quality Control (SQC) methods. The limits are used to calculate TI's Average Outgoing Quality Level (AOQL).
(2) Dropout voltage is defined as the input to output differential at which the output voltage drops 100 mV below the value measured with a
1V differential.
(3) The ON/OFF inputs must be properly driven to prevent misoperation. For details, refer to APPLICATION HINTS.
(4) See TYPICAL PERFORMANCE CHARACTERISTICS curve(s).
Copyright © 2000–2013, Texas Instruments Incorporated
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