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LMH6714 Datasheet, PDF (3/30 Pages) National Semiconductor (TI) – Wideband Video Op Amp; Single, Single with Shutdown and Quad
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LMH6714, LMH6720
LMH6722, LMH6722-Q1
SNOSA39G – NOVEMBER 2002 – REVISED APRIL 2013
Operating Ratings(1)
Thermal Resistance Package
5-Pin SOT-23 (DBV)
6-Pin SOT-23 (DBV)
8-Pin SOIC (D)
14-Pin SOIC (D)
14-Pin TSSOP (PW)
14-Pin WSON (NHK)
Operating Temperature
Supply Voltage Range
LMH6722Q
All others
(θJA)
232°C/W
198°C/W
145°C/W
130°C/W
160°C/W
46°C/W
−40°C to 125°C
−40°C to 85°C
8V (±4V) to 12.5V (±6.25V)
(1) Absolute Maximum Ratings indicate limits beyond which damage to the device may occur. Operating Ratings indicate conditions for
which the device is intended to be functional, but specific performance is not ensured. For specific specifications, see the Electrical
Characteristics tables.
Electrical Characteristics
Unless specified, AV = +2, RF = 300Ω: VCC = ±5V, RL = 100Ω, LMH6714/LMH6720/LMH6722. Boldface limits apply at
temperature extremes.
Symbol
Parameter
Conditions
Min (1)
Typ (2)
Max (1)
Units
Frequency Domain Response
SSBW
LSBW
LSBW
−3dB Bandwidth
−3dB Bandwidth
−3dB Bandwidth, LMH6722
TSSOP package only
VOUT = 0.5VPP
VOUT = 2.0VPP
VOUT = 2.0VPP
345
400
200
250
170
250
MHz
MHz
MHz
GFP
Gain Flatness
Peaking
VOUT = 2VPP
DC to 120MHz
0.1
dB
GFR
Rolloff
DC to 120MHz
0.1
dB
LPD
Linear Phase Deviation
DC to 120MHz
0.5
deg
DG
Differential Gain
DG
Differential Gain
DP
Differential Phase
Time Domain Response
RL = 150Ω, 4.43MHz (LMH6714)
RL = 150Ω, 4.43MHz (LMH6720)
RL = 150Ω, 4.43MHz
0.01
%
0.02
%
0.01
deg
TRS
Rise and Fall Time
.5V Step
1.5
ns
TRL
2V Step
2.6
ns
ts
Settling Time to 0.05%
SR
Slew Rate
2V Step
6V Step
1200
12
1800
ns
V/µs
Distortion and Noise Response
HD2
HD3
IMD
2nd Harmonic Distortion
3rd Harmonic Distortion
3rd Order Intermodulation
Products
2VPP, 20MHz
2VPP, 20MHz
10MHz, POUT = 0dBm
−58
dBc
−70
dBc
−78
dBc
Equivalent Input Noise
VN
Non-Inverting Voltage
>1MHz
3.4
nV/√Hz
NICN
Inverting Current
>1MHz
10
pA/√Hz
ICN
Non-Inverting Current
>1MHz
1.2
pA/√Hz
(1) All limits are specified by testing, design, or statistical analysis.
(2) Typical values represent the most likely parametric norm at the time of characterization. Actual typical values may vary over time and
will also depend on the application and configuration. The typical values are not tested and are not ensured on shipped production
material.
Copyright © 2002–2013, Texas Instruments Incorporated
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