TPS73734 Datasheet, PDF (2/21 Pages) Texas Instruments – 1A, Low-Dropout Voltage Regulator for C2000™

TPS73734
SBVS165 – JUNE 2011
www.ti.com
This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with
appropriate precautions. Failure to observe proper handling and installation procedures can cause damage.
ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more
susceptible to damage because very small parametric changes could cause the device not to meet its published specifications.
PRODUCT
TPS737xx yy yz
ORDERING INFORMATION⁽¹⁾
V_OUT ⁽²⁾
XX is nominal output voltage (for example, 25 = 2.5V⁽³⁾).
YYY is package designator.
Z is package quantity.
(1) For the most current package and ordering information see the Package Option Addendum at the end of this document, or visit the
device product folder at www.ti.com.
(2) Most output voltages of 1.25V and 1.3V to 5.0V in 100mV increments are available on a quick-turn basis using innovative factory
package-level programming. Minimum order quantities apply; contact factory for details and availability.
(3) For fixed 1.20V operation, tie FB to OUT.
ABSOLUTE MAXIMUM RATINGS⁽¹⁾
Over operating free-air temperature range unless otherwise noted.
PARAMETER
TPS73734
V_IN range
V_EN range
V_OUT range
V_NR, V_FB range
Peak output current
–0.3 to +6.0
–0.3 to +6.0
–0.3 to +5.5
–0.3 to +6.0
Internally limited
Output short-circuit duration
Indefinite
Continuous total power dissipation
See Thermal Information table
Junction temperature range, T_J
Storage temperature range
–55 to +150
–65 to +150
ESD rating, HBM
2
ESD rating, CDM
500
UNIT
V
V
V
V
°C
°C
kV
V
(1) Stresses beyond those listed under Absolute Maximum Ratings may cause permanent damage to the device. These are stress ratings
only, and functional operation of the device at these or any other conditions beyond those indicated under the Electrical Characteristics
is not implied. Exposure to absolute maximum rated conditions for extended periods may affect device reliability.
2
Copyright © 2011, Texas Instruments Incorporated