 English |
|
|
|
|
|
|
|
| THS770006_14 Datasheet, PDF (2/40 Pages) Texas Instruments – Broadband, Fully-Differential, 14-/16-Bit ADC DRIVER AMPLIFIER | |||
| |||
| ◁ |
THS770006
SBOS520B â JULY 2010 â REVISED JANUARY 2012
www.ti.com
This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with
appropriate precautions. Failure to observe proper handling and installation procedures can cause damage.
ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more
susceptible to damage because very small parametric changes could cause the device not to meet its published specifications.
PRODUCT
THS770006
PACKAGE
TYPE
VQFN-24
PACKAGE/ORDERING INFORMATION(1)
PACKAGE
DESIGNATOR
SPECIFIED
TEMPERATURE
RANGE
PACKAGE
MARKING
ORDERING
NUMBER
RGE
â40°C to +85°C
THS770006IGRE THS770006IRGET
THS770006IGRE THS770006IRGER
TRANSPORT
MEDIA, QUANTITY
Tape and reel, 250
Tape and reel, 3000
(1) For the most current package and ordering information see the Package Option Addendum at the end of this document, or visit the
device product folder on www.ti.com.
DEVICE MARKING INFORMATION
THS7700
06IRGE
TI YMS
LLLL
= Pin 1 designator
THS770006IRGE = device name
TI = TI LETTERS
YM = YEAR MONTH DATE CODE
S = ASSEMBLY SITE CODE
LLLL = ASSY LOT CODE
ABSOLUTE MAXIMUM RATINGS(1)
Over operating free-air temperature range, unless otherwise noted.
Power supply (VS+ to GND)
Input voltage range
Differential input voltage, VID
Continuous input current, II
Continuous output current, IO
Storage temperature range, Tstg
Maximum junction temperature, TJ
Maximum junction temperature, continuous operation, long term reliability
Human body model (HBM)
ESD ratings
Charged device model (CDM)
Machine model (MM)
THS770006
5.5
Ground to VS+
Ground to VS+
10
100
â40°C to +125°C
+150
+125
2500
1000
100
UNIT
V
V
V
mA
mA
°C
°C
°C
V
V
V
(1) Stresses above these ratings may cause permanent damage. Exposure to absolute maximum conditions for extended periods may
degrade device reliability. These are stress ratings only, and functional operation of the device at these or any other conditions beyond
those specified is not implied.
2
Submit Documentation Feedback
Product Folder Link(s): THS770006
Copyright © 2010â2012, Texas Instruments Incorporated
|
▷ |
German
Russian
Spanish
Italian
Polish
Chinese
Japanese
Korean
French
Portuguese