CD4021B-Q1 Datasheet, PDF (2/14 Pages) Texas Instruments – CMOS 8-STAGE STATIC SHIFT REGISTER

CD4021B-Q1
SCHS378 – MARCH 2010
www.ti.com
This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with
appropriate precautions. Failure to observe proper handling and installation procedures can cause damage.
ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more
susceptible to damage because very small parametric changes could cause the device not to meet its published specifications.
Functional Diagram
Logic Diagram
2
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