ADS5444-SP_15 Datasheet, PDF (2/22 Pages) Texas Instruments – CLASS V, 13 BIT, 250 MSPS ANALOG-TO-DIGITAL CONVERTER

ADS5444-SP
SGLS391C – MARCH 2008 – REVISED JANUARY 2014
www.ti.com
This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with
appropriate precautions. Failure to observe proper handling and installation procedures can cause damage.
ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more
susceptible to damage because very small parametric changes could cause the device not to meet its published specifications.
ABSOLUTE MAXIMUM RATINGS
over operating temperature range (unless otherwise noted)⁽¹⁾
Supply voltage ^{AVDD to GND}
DRV_DD to GND
Analog input to GND
Clock input to GND
CLK to CLK
Digital data output to GND
T_C
Characterized case operating temperature range
T_J
Maximum junction temperature
T_stg
Storage temperature range
ESD Human Body Model (HBM)
VALUE/UNIT
6V
5V
–0.3 V to AV_DD + 0.3 V
–0.3 V to AV_DD + 0.3 V
±2.5 V
–0.3 V to DRV_DD + 0.3 V
–55°C to 125°C
150°C
–65°C to 150°C
2.5 kV
(1) Stresses above these ratings may cause permanent damage. Exposure to absolute maximum conditions for extended periods may
degrade device reliability. These are stress ratings only and functional operation of the device at these or any other conditions beyond
those specified is not implied.
RECOMMENDED OPERATING CONDITIONS
SUPPLIES
AV_DD
Analog supply voltage
DRV_DD Output driver supply voltage
ANALOG INPUT
Differential input range
V_CM
Input common mode
CLOCK INPUT
ADCLK input sample rate (sine wave)
Clock amplitude, differential sine wave
Clock duty cycle
T_C
Operating case temperature
MIN NOM MAX UNIT
4.75
5 5.25 V
3
3.3
3.6 V
2.2
V_PP
2.4
V
10
–55
3
50%
250 MSPS
V_PP
125 °C
2
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