74AC11379_10 Datasheet, PDF (2/7 Pages) Texas Instruments – QUAD D- TYPE FLIP FLOP WITH DATA ENABLE

74AC11379
QUAD D-TYPE FLIP-FLOP
WITH CLOCK ENABLE
SCAS104 − MARCH 1990 − REVISED APRIL 1993
logic symbol^†
logic diagram (positive logic)
19
CLKEN
12
CLK
18
1D
17
2D
14
3D
13
4D
G1
1C2
2D
20
1Q
1
1Q
2
2Q
3
2Q
8
3Q
9
3Q
10
4Q
11
4Q
† _{This symbol is in accordance with ANSI/IEEE Std 91-1984 and}
IEC Publication 617-12.
19
CLKEN
12
CLK
18
1D
17
2D
14
3D
13
4D
C1
1D
C1
1D
C1
1D
C1
1D
20 _1Q
1 _1Q
2 _2Q
3 _2Q
8 _3Q
9 _3Q
10 _4Q
11 _4Q
absolute maximum ratings over operating free-air temperature range (unless otherwise noted)^‡
Supply voltage range, V_CC . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . −0.5 V to 7 V
Input voltage range, V_I (see Note 1) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . −0.5 V to V_CC + 0.5 V
Output voltage range, V_O (see Note 1) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . −0.5 V to V_CC + 0.5 V
Input clamp current, I_IK (V_I < 0 or V_I > V_CC) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . ± 20 mA
Output clamp current, I_OK (V_O < 0 or V_O > V_CC) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . ± 50 mA
Continuous output current, I_O (V_O = 0 to V_CC) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . ±50 mA
Continuous current through V_CC or GND pins . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . ±150 mA
Storage temperature range . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . −65°C to 150°C
‡ _{Stresses beyond those listed under “absolute maximum ratings” may cause permanent damage to the device. These are stress ratings only, and}
functional operation of the device at these or any other conditions beyond those indicated under “recommended operating conditions” is not
implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
NOTE 1: The input and output voltage ratings may be exceeded if the input and output clamp-current ratings are observed.
2
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