TLC27M4_15 Datasheet, PDF (19/52 Pages) Texas Instruments – PRECISION QUAD OPERATIONAL AMPLIFIERS

TLC27M4, TLC27M4A, TLC27M4B, TLC27M4Y, TLC27M9
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SLOS093D – OCTOBER 1987 – REVISED OCTOBER 2012
PARAMETER MEASUREMENT INFORMATION (continued)
Full-Power Response
Full-power response, the frequency above which the operational amplifier slew rate limits the output voltage
swing, is often specified two ways: full-linear response and full-peak response. The full-linear response is
generally measured by monitoring the distortion level of the output, while increasing the frequency of a sinusoidal
input signal until the maximum frequency is found above which the output contains significant distortion. The full-
peak response is defined as the maximum output frequency, without regard to distortion, above which full peak-
to-peak output swing cannot be maintained.
Because there is no industry-wide accepted value for significant distortion, the full-peak response is specified in
this data sheet and is measured using the circuit of Figure 1. The initial setup involves the use of a sinusoidal
input to determine the maximum peak-to-peak output of the device (the amplitude of the sinusoidal wave is
increased until clipping occurs). The sinusoidal wave is then replaced with a square wave of the same amplitude.
The frequency is then increased until the maximum peak-to-peak output can no longer be maintained (Figure 5).
A square wave is used to allow a more accurate determination of the point at which the maximum peak-to-peak
output is reached.
(a) f = 1 kHz
(b) 1 kHz < f < B_OM
(c) f = B_OM
Figure 5. Full-Power-Response Output Signal
(d) f > B_OM
Test Time
Inadequate test time is a frequent problem, especially when testing CMOS devices in a high-volume, short-test-
time environment. Internal capacitances are inherently higher in CMOS than in bipolar and BiFET devices and
require longer test times than their bipolar and BiFET counterparts. The problem becomes more pronounced with
reduced supply levels and lower temperatures.
Copyright © 1987–2012, Texas Instruments Incorporated
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