LM3S5747 Datasheet, PDF (166/890 Pages) Texas Instruments – Stellaris® LM3S5747 Microcontroller

JTAG Interface
4.3.1.3
4.3.1.4
4.3.2
Because the TMS pin is sampled on the rising edge of TCK, the IEEE Standard 1149.1 expects the
value on TMS to change on the falling edge of TCK.
Holding TMS high for five consecutive TCK cycles drives the TAP controller state machine to the
Test-Logic-Reset state. When the TAP controller enters the Test-Logic-Reset state, the JTAG
module and associated registers are reset to their default values. This procedure should be performed
to initialize the JTAG controller. The JTAG Test Access Port state machine can be seen in its entirety
in Figure 4-2 on page 167.
By default, the internal pull-up resistor on the TMS pin is enabled after reset. Changes to the pull-up
resistor settings on GPIO Port C should ensure that the internal pull-up resistor remains enabled
on PC1/TMS; otherwise JTAG communication could be lost.
Test Data Input (TDI)
The TDI pin provides a stream of serial information to the IR chain and the DR chains. TDI is
sampled on the rising edge of TCK and, depending on the current TAP state and the current
instruction, presents this data to the proper shift register chain. Because the TDI pin is sampled on
the rising edge of TCK, the IEEE Standard 1149.1 expects the value on TDI to change on the falling
edge of TCK.
By default, the internal pull-up resistor on the TDI pin is enabled after reset. Changes to the pull-up
resistor settings on GPIO Port C should ensure that the internal pull-up resistor remains enabled
on PC2/TDI; otherwise JTAG communication could be lost.
Test Data Output (TDO)
The TDO pin provides an output stream of serial information from the IR chain or the DR chains.
The value of TDO depends on the current TAP state, the current instruction, and the data in the
chain being accessed. In order to save power when the JTAG port is not being used, the TDO pin
is placed in an inactive drive state when not actively shifting out data. Because TDO can be connected
to the TDI of another controller in a daisy-chain configuration, the IEEE Standard 1149.1 expects
the value on TDO to change on the falling edge of TCK.
By default, the internal pull-up resistor on the TDO pin is enabled after reset. This assures that the
pin remains at a constant logic level when the JTAG port is not being used. The internal pull-up and
pull-down resistors can be turned off to save internal power if a High-Z output value is acceptable
during certain TAP controller states.
JTAG TAP Controller
The JTAG TAP controller state machine is shown in Figure 4-2 on page 167. The TAP controller
state machine is reset to the Test-Logic-Reset state on the assertion of a Power-On-Reset (POR).
In order to reset the JTAG module after the device has been powered on, the TMS input must be
held HIGH for five TCK clock cycles, resetting the TAP controller and all associated JTAG chains.
Asserting the correct sequence on the TMS pin allows the JTAG module to shift in new instructions,
shift in data, or idle during extended testing sequences. For detailed information on the function of
the TAP controller and the operations that occur in each state, please refer to IEEE Standard 1149.1.
166
November 17, 2011
Texas Instruments-Production Data