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SN65LVDS314 Datasheet, PDF (16/44 Pages) Texas Instruments – PROGRAMMABLE 27-BIT SERIAL-TO-PARALLEL RECEIVER
SN65LVDS314
SLLSE98A – AUGUST 2012 – REVISED SEPTEMBER 2012
www.ti.com
INPUT ELECTRICAL CHARACTERISTICS
over operating free-air temperature range (unless otherwise noted)
PARAMETER
TEST CONDITIONS
MIN TYP(1)
MAX UNIT
D0+, D0–, D1+, D1–, D2+, D2–, CLK+, and CLK–
Vthstby Input voltage common mode threshold to RXEN at VDD
switch between receive/acquire mode and
standby mode
1.3
0.9×VDDLVDS
V
VTHL Low-level differential input voltage
VD0+–VD0–, VD1+–VD1–, VD2+–VD2–,
–40
threshold
VCLK+–VCLK-
VTHH High-level differential input voltage
threshold
mV
40 mV
II+, II–
IIOFF
RID
CIN
Input leakage current
Power-off input current
Differential input termination resistor value
VDD=1.95 V; VI+ = VI–;
VI = 0.4 V and VI = 1.5 V
VDD=GND; VI = 1.5V
Input capacitance
Measured between input terminal
and GND
78
100
1
75 μA
–75 μA
122 Ω
pF
ΔCIN Input capacitance variation
Within one signal pair
Between all signals
0.2
pF
1
RBBDC Pull-up resistor for standby detection
LS0, LS1, CPOL, SWAP, RXEN, F/S
21
30
39 kΩ
VIK Input clamp voltage
IICMOS Input current(2)
CIN Input capacitance
IIH
High-level input current
IIL
Low-level input current
VIH High-level input voltage
VIL Low-level input voltage
II= –18 mA, VDD=VDD(min)
0 V ≤ VDD≤ 1.95 V; VI=GND or
VI=1.95 V
VIN = 0.7 × VDD
VIN = 0.3 × VDD
-1.2 V
100 nA
2
pF
-200
–200
200
nA
200
0.7×VDD
0
VDD
V
0.3×VDD
(1) All typical values are at 25°C and with 1.8 V supply unless otherwise noted.
(2) Do not leave any CMOS Input unconnected or floating to minimize leakage currents. Every input must be connected to a valid logic level
VIH or VOL while power is supplied to VDD.
16
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