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AMC1306E05_017 Datasheet, PDF (11/38 Pages) Texas Instruments – Small, High-Precision, Reinforced Isolated Delta-Sigma Modulators with High CMTI
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AMC1306E05, AMC1306E25, AMC1306M05, AMC1306M25
SBAS734A – MARCH 2017 – REVISED JULY 2017
7.11 Switching Characteristics
over operating free-air temperature range (unless otherwise noted)
PARAMETER
TEST CONDITIONS
fCLKIN CLKIN clock frequency
4.5 V ≤ AVDD ≤ 5.5 V
3.0 V ≤ AVDD ≤ 5.5 V
tCLKIN CLKIN clock period
4.5 V ≤ AVDD ≤ 5.5 V
3.0 V ≤ AVDD ≤ 5.5 V
tHIGH
tLOW
tH
tD
CLKIN clock high time
CLKIN clock low time
DOUT hold time after rising edge
of CLKIN
Rising edge of CLKIN to DOUT
valid delay
AMC1306Mx (1),
CLOAD = 15 pF
AMC1306Mx(1), CLOAD = 15 pF
tr
DOUT rise time
tf
DOUT fall time
tISTART Interface startup time
10% to 90%, 2.7 V ≤ DVDD ≤ 3.6 V,
CLOAD = 15 pF
10% to 90%, 4.5 V ≤ DVDD ≤ 5.5 V,
CLOAD = 15 pF
90% to 10%, 2.7 V ≤ DVDD ≤ 3.6 V,
CLOAD = 15 pF
90% to 10%, 4.5 V ≤ DVDD ≤ 5.5 V,
CLOAD = 15 pF
DVDD at 2.7 V (min) to DOUT valid with
AVDD ≥ 3.0 V
tASTART Analog startup time
AVDD step to 3.0 V with DVDD ≥ 2.7 V,
0.1% settling
MIN
TYP
MAX UNIT
5
21
MHz
5
20
47.6
200
ns
50
200
20
25
120
ns
20
25
120
ns
3.5
ns
15
ns
0.8
3.5
ns
1.8
3.9
0.8
3.5
ns
1.8
3.9
32
32
CLKIN
cycles
0.5
ms
(1) The output of the Manchester encoded versions of the AMC1306Ex can change with every edge of CLKIN with a typical delay of 6 ns;
see the Manchester Coding Feature section for additional details.
tCLKIN
tHIGH
CLKIN
tLOW
tH
tD
tr / tf
DOUT
Figure 1. Digital Interface Timing
AVDD
DVDD
CLKIN
DOUT
tASTART
...
Test Pattern
tISTART
Bitream not valid
(analog settling)
Figure 2. Device Startup Timing
Valid bitstream
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