TMS470MF04207_16 Datasheet, PDF (1/68 Pages) Texas Instruments – TMS470MF04207/TMS470MF03107 16/32-Bit RISC Flash Microcontroller

TMS470MF04207
TMS470MF03107
www.ti.com
SPNS159C – JANUARY 2012
TMS470MF04207/TMS470MF03107 16/32-Bit RISC Flash
Microcontroller
Check for Samples: TMS470MF04207, TMS470MF03107
1 Features
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• High-Performance Automotive Grade
Microcontroller with Safety Features
– Full Automotive Temperature Range
– ECC on Flash and SRAM
– CPU and Memory BIST (Built-In Self Test)
• ARM Cortex™-M3 32-Bit RISC CPU
– Efficient 1.2 DMIPS/MHz
– Optimized Thumb2 Instruction Set
– Memory Protection Unit (MPU)
– Open Architecture With Third-Party Support
– Built-In Debug Module
• Operating Features
– Up to 80MHz System Clock
– Single 3.3V Supply Voltage
• Integrated Memory
– 448KB Total Program Flash with ECC
– Support for Flash EEPROM Emulation
– 24K-Byte Static RAM (SRAM) with ECC
• Key Peripherals
– High-End Timer, MibADC, CAN, MibSPI
• Common TMS470M/570 Platform Architecture
– Consistent Memory Map across the family
– Real-Time Interrupt Timer (RTI)
– Digital Watchdog
– Vectored Interrupt Module (VIM)
– Cyclic Redundancy Checker (CRC)
• Frequency-Modulated Zero-Pin Phase-Locked
Loop (FMzPLL)-Based Clock Module
– Oscillator and PLL clock monitor
• Up to 49 Peripheral IO pins
– 4 Dedicated GIO - w/ External Interrupts
• Two External Clock Prescale (ECP) Modules
– Programmable Low-Frequency External
Clock (ECLK)
– One Dedicated Pin and One Muxed
ECLK/HET pin
• Communication Interfaces
– Two CAN Controllers
• One with 32 mailboxes, one with 16
• Parity on mailbox RAM
– Two Multi-buffered Serial Peripheral
Interface (MibSPI)
• 12 total chip selects
• 64 buffers with parity on each
– Two UART (SCI) interfaces
• H/W Support for Local Interconnect
Network (LIN 2.1 master mode)
• High-End Timer (HET)
– Up to 16 Programmable I/O Channels
– 128-Word High-End Timer RAM with Parity
• 16-Channel 10-Bit Multi-Buffered ADC
(MibADC)
– 64-Word FIFO Buffer with Parity
– Single- or Continuous-Conversion Modes
– 1.55 µs Minimum Sample/Conversion Time
– Calibration Mode and Self-Test Features
• On-Chip Scan-Base Emulation Logic
– IEEE Standard 1149.1 (JTAG) Test-Access
Port and Boundary Scan
• Packages supported
– 100-Pin Plastic Quad Flatpack (PZ Suffix)
– Green/Lead-Free
• Development Tools Available
– Development Boards
– Code Composer Studio™ Integrated
Development Environment (IDE)
– HET Assembler and Simulator
– nowFlash™ Flash Programming Tool
• Community Resources
– TI E2E Community
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Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
PRODUCTION DATA information is current as of publication date. Products conform to
specifications per the terms of the Texas Instruments standard warranty. Production
processing does not necessarily include testing of all parameters.
Copyright © 2012, Texas Instruments Incorporated