SN74LVT18504 Datasheet, PDF (1/32 Pages) Texas Instruments – 3.3-V ABT SCAN TEST DEVICE WITH 20-BIT UNIVERSAL BUS TRANSCEIVERS

SN74LVT18504
3.3ĆV ABT SCAN TEST DEVICE
WITH 20ĆBIT UNIVERSAL BUS TRANSCEIVERS
SCBS163F − AUGUST 1993 − REVISED JULY 1996
D Member of the Texas Instruments SCOPE 
Family of Testability Products
D Member of the Texas Instruments
Widebus  Family
D State-of-the-Art 3.3-V ABT Design Supports
Mixed-Mode Signal Operation (5-V Input
and Output Voltages With 3.3-V V_CC)
D Supports Unregulated Battery Operation
Down to 2.7 V
D UBT  (Universal Bus Transceiver)
Combines D-Type Latches and D-Type
Flip-Flops for Operation in Transparent,
Latched, or Clocked Mode
D Bus-Hold Data Inputs Eliminate the Need
for External Pullup Resistors
D Compatible With the IEEE Standard
1149.1-1990 (JTAG) Test Access Port
and Boundary-Scan Architecture
D SCOPE  Instruction Set
− IEEE Standard 1149.1-1990 Required
Instructions and Optional CLAMP and
HIGHZ
− Parallel-Signature Analysis at Inputs
− Pseudo-Random Pattern Generation
From Outputs
− Sample Inputs/Toggle Outputs
− Binary Count From Outputs
− Device Identification
− Even-Parity Opcodes
D Packaged in 64-Pin Plastic Thin Quad Flat
Packages Using 0.5-mm Center-to-Center
Spacings
PM PACKAGE
(TOP VIEW)
A4
A5
A6
GND
A7
A8
A9
A10
V_CC
A11
A12
A13
GND
A14
A15
A16
64 63 62 61 60 59 58 57 56 55 54 53 52 51 50 49
1
48
2
47
3
46
4
45
5
44
6
43
7
42
8
41
9
40
10
39
11
38
12
37
13
36
14
35
15
34
16
33
17 18 19 20 21 22 23 24 25 26 27 28 29 30 31 32
B5
B6
B7
GND
B8
B9
B10
V_CC
B11
B12
B13
B14
GND
B15
B16
B17
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
SCOPE, Widebus, and UBT are trademarks of Texas Instruments Incorporated.
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of Texas Instruments
standard warranty. Production processing does not necessarily include
testing of all parameters.
Copyright  1996, Texas Instruments Incorporated
• POST OFFICE BOX 655303 DALLAS, TEXAS 75265
• POST OFFICE BOX 1443 HOUSTON, TEXAS 77251−1443
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