SN74HC4060-Q1 Datasheet, PDF (1/13 Pages) Texas Instruments – 14-STAGE ASYNCHRONOUS BINARY COUNTERS AND OSCILLATORS

SN74HC4060−Q1
14-STAGE ASYNCHRONOUS BINARY COUNTERS AND OSCILLATORS
D Qualified for Automotive Applications
D Wide Operating Voltage Range of 2 V to 6 V
D Outputs Can Drive Up To 10 LSTTL Loads
D Low Power Consumption, 80-μA Max I_CC
D Typical t_pd = 14 ns
SCLS726 − DECEMBER 2011
D ±4-mA Output Drive at 5 V
D Low Input Current of 1 μA Max
D Allow Design of Either RC- or
Crystal-Oscillator Circuits
SN74HC4060−Q1 . . . D PACKAGE
(TOP VIEW)
Q_{L 1}
Q_M 2
Q_N 3
Q_F 4
Q_E 5
Q_G 6
Q_D 7
GND 8
16 ^VCC
15 Q_J
14 Q_H
13 Q_I
12 CLR
11 CLKI
10 CLKO
9 CLKO
description/ordering information
The ’HC4060−Q1 devices consist of an oscillator section and 14 ripple-carry binary counter stages. The
oscillator configuration allows design of either RC- or crystal-oscillator circuits. A high-to-low transition on the
clock (CLKI) input increments the counter. A high level at the clear (CLR) input disables the oscillator (CLKO
goes high and CLKO goes low) and resets the counter to zero (all Q outputs low).
ORDERING INFORMATION
T_A
PACKAGE^†
ORDERABLE
PART NUMBER
TOP-SIDE
MARKING
−40°C to 125°C
SOIC − D
Reel of 2500 SN74HC4060QDRQ1
HC4060Q
† _{Package drawings, standard packing quantities, thermal data, symbolization, and PCB design guidelines are}
available at www.ti.com/sc/package.
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of Texas Instruments
standard warranty. Production processing does not necessarily include
testing of all parameters.
• POST OFFICE BOX 655303 DALLAS, TEXAS 75265
Copyright © 2011, Texas Instruments Incorporated
On products compliant to MIL-PRF-38535, all parameters are tested
unless otherwise noted. On all other products, production
processing does not necessarily include testing of all parameters.
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